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Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion

Suh, J. and Weinstein, A. J. and Schwab, K. C. (2013) Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion. Applied Physics Letters, 103 (5). Art. No. 052604. ISSN 0003-6951. doi:10.1063/1.4816428.

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We show that the two-level systems (TLS) in lithographic superconducting circuits act as a power-dependent dielectric leading to non-linear responses in a parametrically coupled electromechanical system. Driven TLS shift the microwave resonance frequency and modulate the mechanical resonance through the optical spring effect. By pumping with two tones in a back-action evading measurement, these effects produce a mechanical parametric instability which limits single quadrature imprecision to 1.4 x_(zp). The microwave resonator noise is also consistent to a TLS-noise model. These observations suggest design strategies for minimizing TLS effects to improve ground-state cooling and quantum non-demolition measurements of motion.

Item Type:Article
Related URLs:
URLURL TypeDescription DOIArticle
Suh, J.0000-0002-0112-0499
Weinstein, A. J.0000-0002-2354-0777
Schwab, K. C.0000-0001-8216-4815
Additional Information:© 2013 AIP Publishing LLC. Received 29 April 2013; accepted 3 July 2013; published online 29 July 2013. We acknowledge funding provided by the Institute for Quantum Information and Matter, an NSF Physics Frontiers Center with support of the Gordon and Betty Moore Foundation (NSF-IQIM 1125565), by DARPA (DARPA-QUANTUM HR0011-10-1-0066), and by NSF (NSF-DMR-1052647 and NSF-EEC 0832819).
Group:Institute for Quantum Information and Matter
Funding AgencyGrant Number
Institute for Quantum Information and Matter (IQIM)UNSPECIFIED
NSF Physics Frontiers CenterUNSPECIFIED
Gordon and Betty Moore FoundationUNSPECIFIED
Defense Advanced Research Projects Agency (DARPA)HR0011-10-1-0066
Subject Keywords:cooling, electromechanical effects, ground states, lithography, micromechanical resonators, microwave resonators, motion measurement, optical pumping, parametric instability, superconducting cavity resonators, superconducting device noise
Issue or Number:5
Classification Code:PACS: 07.10.Cm; 85.25.Qc; 85.85.+j; 06.30.Bp
Record Number:CaltechAUTHORS:20130930-142615270
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:41563
Deposited By: Tony Diaz
Deposited On:30 Sep 2013 21:50
Last Modified:10 Nov 2021 04:31

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