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Low Energy X-Ray Spectra Measured with a Mercuric Iodide Energy Dispersive Spectrometer in a Scanning Electron Microscope

Iwanczyk, J. S. and Dabrowski, A. J. and Huth, G. C. and Bradley, J. G. and Conley, J. M. and Albee, A. L. (1986) Low Energy X-Ray Spectra Measured with a Mercuric Iodide Energy Dispersive Spectrometer in a Scanning Electron Microscope. IEEE Transactions on Nuclear Science, 33 (1). pp. 355-358. ISSN 0018-9499. doi:10.1109/TNS.1986.4337118. https://resolver.caltech.edu/CaltechAUTHORS:20131008-143821891

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Abstract

A mercuric iodide energy dispersive x-ray spectrometer, with Peltier cooling provided for the detector and input field effect transistor, has been developed and tested in a scanning electron microscope. X-ray spectra were obtained with the 15 keV electron beam. An energy resolution of 225 eV (FWHM) for Mn-Kα at 5.9 keV and 195 eV (FWHM) for Mg-K line at 1.25 keV has been measured. Overall system noise level was 175 eV (FWHM). The detector system characterization with a carbon target demonstrated good energy sensitivity at low energies and lack of significant spectral artifacts at higher energies.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4337118PublisherArticle
http://dx.doi.org/10.1109/TNS.1986.4337118DOIArticle
Additional Information:© 1986 IEEE. Published: Feb. 1986. The authors wish to thank B. Dancy, F. Riquelme and P. Rohmer at USC and V. Taylor at JPL for valuable technical assistance. Research described in this paper was performed, in part, by Jet Propulsion Laboratory, California Institute of Technology under NASA Contract NAS 7-918. Fundamental HgI2 x-ray detector development at USC was supported by DOE Contract DE-AM03-76SF00113 and NASA Contract NSG-7535.
Funders:
Funding AgencyGrant Number
NASANAS 7-918
Department of Energy (DOE)DE-AM03-76SF00113
NASANSG-7535
Issue or Number:1
DOI:10.1109/TNS.1986.4337118
Record Number:CaltechAUTHORS:20131008-143821891
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20131008-143821891
Official Citation:Iwanczyk, J.S.; Dabrowski, A.J.; Huth, G.C.; Bradley, J. G.; Conley, J. M.; Albee, A. L., "Low Energy X-Ray Spectra Measured with a Mercuric Iodide Energy Dispersive Spectrometer in a Scanning Electron Microscope," Nuclear Science, IEEE Transactions on , vol.33, no.1, pp.355,358, Feb. 1986 doi: 10.1109/TNS.1986.4337118
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:41749
Collection:CaltechAUTHORS
Deposited By:INVALID USER
Deposited On:08 Oct 2013 22:32
Last Modified:10 Nov 2021 04:34

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