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Insitu measurement of osmium concentrations in iron meteorites by resonance ionization of sputtered atoms

Blum, Joel D. and Pellin, M. J. and Calaway, W. F. and Young, C. E. and Gruen, D. M. and Hutcheon, I. D. and Wasserburg, G. J. (1990) Insitu measurement of osmium concentrations in iron meteorites by resonance ionization of sputtered atoms. Geochimica et Cosmochimica Acta, 54 (3). pp. 875-881. ISSN 0016-7037. https://resolver.caltech.edu/CaltechAUTHORS:20131029-122031160

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Abstract

Resonance ionization of sputtered atoms followed by time-of-flight mass spectrometry was used for in situ quantitative measurement of Os with a spatial resolution of ∼70 μm. Osmium concentrations in synthetic metals and iron meteorites were measured to demonstrate the analytical capabilities of the technique. A linear correlation between Os+ signal intensity and the known Os concentration was observed over a range of nearly 10^4 in Os concentration with an accuracy of ∼ ±10%, a minimum detection limit of 7 parts per billion atomic, and a useful yield of 1%. Resonance ionization of sputtered atoms samples the dominant neutral-fraction of sputtered atoms and utilizes multiphoton resonance ionization to achieve high sensitivity and to eliminate atomic and molecular interferences. Matrix effects should be small compared to secondary ion mass spectrometry because ionization occurs in the gas phase and is largely independent of the physical properties of the matrix material. Resonance ionization of sputtered atoms can be applied to in situ chemical analysis of most high ionization-potential elements (including all of the Pt-group elements) in a wide range of natural and synthetic materials. The high useful yield and elemental selectivity of this method should eventually allow the in situ measurement of Os isotope ratios in some natural samples and in sample extracts enriched in Pt-group elements by fire assay fusion.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/0016-7037(90)90380-4DOIArticle
http://www.sciencedirect.com/science/article/pii/0016703790903804PublisherArticle
ORCID:
AuthorORCID
Gruen, D. M.0000-0003-3270-7644
Alternate Title:In situ measurement of osmium concentrations in iron meteorites by resonance ionization of sputtered atoms
Additional Information:© 1990 Pergamon Press. Received December 1, 1989; accepted in revised form February 2, 1990. We thank J. Whitten for technical assistance. J. T. Wasson for providing meteorite specimens, G. R. Rossman and E. M. Stolper for the use of furnaces, and L. Brown. G. P. Russ, K. K. Turekian, and an anonymous referee for reviews. This study was performed as part of a doctoral dissertation by the senior author at the California Institute of Technology. (Caltech). Work was supported by the US Dept. of Energy through BES-Material Sciences contract W-31-109-ENG-38 to Argonne National Laboratory and BES-Engineering and Geosciences Grant DE-FG03-88ER13851 to Caltech. Caltech Division of Geological and Planetary Sciences Contribution Number 4817 (687). Editorial handling: G. Faure.
Funders:
Funding AgencyGrant Number
Department of Energy (DOE)W-31-109-ENG-38
Department of Energy (DOE)DE-FG03-88ER13851
Other Numbering System:
Other Numbering System NameOther Numbering System ID
Caltech Division of Geological and Planetary Sciences4817
Lunatic Asylum Lab687
Issue or Number:3
Record Number:CaltechAUTHORS:20131029-122031160
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20131029-122031160
Official Citation:Joel D Blum, M.J Pellin, W.F Calaway, C.E Young, D.M Gruen, I.D Hutcheon, G.J Wasserburg, Insitu measurement of osmium concentrations in iron meteorites by resonance ionization of sputtered atoms, Geochimica et Cosmochimica Acta, Volume 54, Issue 3, March 1990, Pages 875-881, ISSN 0016-7037, http://dx.doi.org/10.1016/0016-7037(90)90380-4.
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:42112
Collection:CaltechAUTHORS
Deposited By: Jason Perez
Deposited On:31 Oct 2013 14:42
Last Modified:03 Oct 2019 05:55

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