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Measuring Earthquakes from Optical Satellite Images

Van Puymbroeck, Nadège and Michel, Rémi and Binet, Renaud and Avouac, Jean-Philippe and Taboury, Jean (2000) Measuring Earthquakes from Optical Satellite Images. Applied Optics, 39 (20). pp. 3486-3494. ISSN 0003-6935. http://resolver.caltech.edu/CaltechAUTHORS:PUYao00

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Abstract

Système pour l'Observation de la Terre images are used to map ground displacements induced by earthquakes. Deformations (offsets) induced by stereoscopic effect and roll, pitch, and yaw of satellite and detector artifacts are estimated and compensated. Images are then resampled in a cartographic projection with a low-bias interpolator. A subpixel correlator in the Fourier domain provides two-dimensional offset maps with independent measurements approximately every 160 m. Biases on offsets are compensated from calibration. High-frequency noise (0.125 m^-1 ) is ~0.01 pixels. Low-frequency noise (lower than 0.001 m^-1 ) exceeds 0.2 pixels and is partially compensated from modeling. Applied to the Landers earthquake, measurements show the fault with an accuracy of a few tens of meters and yields displacement on the fault with an accuracy of better than 20 cm. Comparison with a model derived from geodetic data shows that offsets bring new insights into the faulting process.


Item Type:Article
Additional Information:© Copyright 2000 Optical Society of America Received 14 December 1999; revised manuscript received 3 May 2000.
Group:Seismological Laboratory
Subject Keywords:Digital image processing; Image analysis; Superresolution; Remote sensing
Record Number:CaltechAUTHORS:PUYao00
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:PUYao00
Alternative URL:http://www.opticsinfobase.org/abstract.cfm?URI=ao-39-20-3486
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:4255
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:09 Aug 2006
Last Modified:11 Jun 2015 13:57

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