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Characterization of Talbot pattern illumination for scanning optical microscopy

Liu, Guangshuo and Yang, Changhuei and Wu, Jigang (2013) Characterization of Talbot pattern illumination for scanning optical microscopy. Optical Engineering, 52 (9). Art. No. 091714. ISSN 0091-3286. doi:10.1117/1.OE.52.9.091714.

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We studied the use of Talbot pattern illumination in scanning optical microscopy (SOM). Unlike conventional illumination spots used in SOM, the focal spots in Talbot pattern are more complicated and do not have a simple Gaussian intensity distribution. To find out the resolution of SOM using Talbot pattern, we characterized the evolution of the full-width-at-half-maximum spot size of the Talbot focal spots by computer simulation. We then simulated the SOM imaging under Talbot pattern illumination using the razor blade and the U.S. Air Force target as the sample objects, and compared the results with those performed with Gaussian spots as illumination. Using several foci searching algorithms, the optimal focal distances were found to be shorter than the theoretical Talbot distances. The simulation results were consistent with the experiment results published previously. We then provide a practical guidance for searching for optimal focal distances in the SOM based on these studies.

Item Type:Article
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Yang, Changhuei0000-0001-8791-0354
Additional Information:© 2013 Society of Photo-Optical Instrumentation Engineers (SPIE). Paper 121759SS received Nov. 30, 2012; revised manuscript received Feb. 26, 2013; accepted for publication Mar. 4, 2013; published online Mar. 22, 2013. This work is supported by the National Science Foundation of China (Grant No. 61205192) and the Shanghai Pujiang Program (Grant No. 12PJ1405100).
Funding AgencyGrant Number
National Science Foundation of China61205192
Shanghai Pujiang Program12PJ1405100
Subject Keywords:Talbot effect; scanning optical microscopy; diffractive optics; autofocusing
Issue or Number:9
Record Number:CaltechAUTHORS:20131121-132206912
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Official Citation:Liu G, Yang C, Wu J; Characterization of talbot pattern illumination for scanning optical microscopy. Opt. Eng. 0001;52(9):091714-091714. doi:10.1117/1.OE.52.9.091714.
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:42621
Deposited On:22 Nov 2013 22:12
Last Modified:10 Nov 2021 16:26

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