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Designing Robustness to Temperature in a Feedforward Loop Circuit

Sen, Shaunak and Kim, Jongmin and Murray, Richard M. (2014) Designing Robustness to Temperature in a Feedforward Loop Circuit. In: 53rd IEEE Conference on Decision and Control. IEEE , Piscataway, NJ, pp. 4629-4634. ISBN 978-1-4799-7746-8. http://resolver.caltech.edu/CaltechAUTHORS:20140424-145318619

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Abstract

'Incoherent feedforward loops' represent important biomolecular circuit elements capable of a rich set of dynamic behavior including adaptation and pulsed responses. Temperature can modulate some of these properties through its effect on the underlying reaction rate parameters. It is generally unclear how to design a circuit where these properties are robust to variations in temperature. Here, we address this issue using a combination of tools from control and dynamical systems theory as well as preliminary experimental measurements towards such a design. Using a structured uncertainty representation, we analyze a standard incoherent feedforward loop circuit, noting mechanisms that intrinsically confer temperature robustness to some of its properties. Further, we study design variants that can enhance this robustness to temperature, including different negative feedback configurations as well as conditions for perfect temperature compensation. Finally, we find that the response of an incoherent feedforward loop circuit in cells can change with temperature. These results present groundwork for the design of a temperature-robust incoherent feedforward loop circuit.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1109/CDC.2014.7040112DOIArticle
https://doi.org/10.1101/000091DOIDiscussion Paper
ORCID:
AuthorORCID
Sen, Shaunak0000-0002-1412-8633
Murray, Richard M.0000-0002-5785-7481
Additional Information:© 2014 IEEE. Research supported in part by the Gordon and Betty Moore Foundation and the NSF Molecular Programming Project. We gratefully acknowledge S. Guo and C. Hayes for their help with the experimental part, especially for providing the E. coli strain containing the biomolecular circuit and the measurement protocol. We also thank the anonymous reviewers for their role in improving the manuscript.
Funders:
Funding AgencyGrant Number
Gordon and Betty Moore FoundationUNSPECIFIED
NSFUNSPECIFIED
Record Number:CaltechAUTHORS:20140424-145318619
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20140424-145318619
Official Citation:S. Sen, J. Kim and R. M. Murray, "Designing robustness to temperature in a feedforward loop circuit," 53rd IEEE Conference on Decision and Control, Los Angeles, CA, 2014, pp. 4629-4634. doi: 10.1109/CDC.2014.7040112
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:45196
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:24 Apr 2014 22:06
Last Modified:27 Mar 2019 18:24

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