Ozawa, Yasunori and Yazami, Rachid and Fultz, Brent (2005) An XRD Study of Chemical Self-Discharge in Delithiated Cobalt Oxide. Electrochemical and Solid-State Letters, 8 (1). A38-A41. ISSN 1099-0062. https://resolver.caltech.edu/CaltechAUTHORS:OZAessl05
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Abstract
Changes in samples of Li1–xCoO2 were measured by X-ray diffractometry (XRD) after thermal aging treatments that cause capacity losses in electrochemical cells. Changes in lattice parameters were used to identify lithium re-intercalation into Li1–xCoO2 when it was aged in the presence of LiClO4, LiPF6, and LiAsF6 in propylene carbonate (PC). Li+ re-intercalation could account for the reversible capacity loss. Thermal aging at 75°C in pure PC or pure argon gas resulted in other changes that are attributed to the formation of spinel phase. The rate of the lithium re-intercalation increases in the following sequence: LiPF6<LiClO4<LiAsF6.
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| Additional Information: | © 2004 The Electrochemical Society. (Revised February 23, 2004; published November 29, 2004) The authors thank ENAX, Inc., Tokyo for providing the LiCoO2 electrode and for financial support and Mitsubishi Chemicals, Japan for providing the electrolyte. This work was supported by DOE through Basic Energy Sciences grant DE-FG03-00ER15035. The California Institute of Technology assisted in meeting the publication costs of this article. | ||||||||
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| Subject Keywords: | X-ray diffraction; lithium compounds; ageing; lattice constants; secondary cells; electrochemistry | ||||||||
| Issue or Number: | 1 | ||||||||
| Record Number: | CaltechAUTHORS:OZAessl05 | ||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:OZAessl05 | ||||||||
| Alternative URL: | http://dx.doi.org/10.1149/1.1830395 | ||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||||
| ID Code: | 4616 | ||||||||
| Collection: | CaltechAUTHORS | ||||||||
| Deposited By: | Archive Administrator | ||||||||
| Deposited On: | 30 Aug 2006 | ||||||||
| Last Modified: | 02 Oct 2019 23:14 |
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