CaltechAUTHORS
  A Caltech Library Service

Monitoring Sintering / Densification and Crystallization / Grain-Growth in Tl-Based High Temperature Superconductors by Electrical Conductivity Measurements

Ratto, Joseph J. and Porter, John R. and Housley, Robert M. and Morgan, Peter E. D. (1990) Monitoring Sintering / Densification and Crystallization / Grain-Growth in Tl-Based High Temperature Superconductors by Electrical Conductivity Measurements. Japanese Journal of Applied Physics, 29 (2). pp. 244-251. ISSN 0021-4922. https://resolver.caltech.edu/CaltechAUTHORS:20140611-082324941

Full text is not posted in this repository. Consult Related URLs below.

Use this Persistent URL to link to this item: https://resolver.caltech.edu/CaltechAUTHORS:20140611-082324941

Abstract

An "in situ" electrical resistance method has been used to monitor sintering to best achieve a high percentage of Tl-2223 structure. By this means, the sequential formation of syntactic intergrowths, 2201, 2212 and 2223 structures, was followed as a function of temperature, time, seeding and gaseous atmosphere. At 895°C, slight melting assists the formation of ~95% pure 2223; the presence of carbonate is probably deleterious.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1143/JJAP.29.244 DOIArticle
http://iopscience.iop.org/1347-4065/29/2R/244/PublisherArticle
Additional Information:© 1990 IOP Publishing. Received September 26, 1989; accepted for publication November 18, 1989. This work was supported by Rockwell International Independent Research and Development Fund.
Funders:
Funding AgencyGrant Number
Rockwell International Independent Research and Development FundUNSPECIFIED
Subject Keywords:high temperature superconductor, TI-Ba-Ca-Cu-O, sintering, electrical resistance method, four point probe method, grain-growth, syntactic, intergrowths, Tl-2201, Tl-2212, Tl-2223
Issue or Number:2
Record Number:CaltechAUTHORS:20140611-082324941
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20140611-082324941
Official Citation:Monitoring Sintering / Densification and Crystallization / Grain-Growth in Tl-Based High Temperature Superconductors by Electrical Conductivity Measurements Joseph J. Ratto et al 1990 Jpn. J. Appl. Phys. 29 244
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:46194
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:11 Jun 2014 16:30
Last Modified:03 Oct 2019 06:42

Repository Staff Only: item control page