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Silicon Detector Studies with an Interferometric Thickness Mapper

Milliken, B. and Leske, R. A. and Wiedenbeck, M. E. (1995) Silicon Detector Studies with an Interferometric Thickness Mapper. In: Proceedings of the 24th International Cosmic Ray Conference. Vol.4. International Union of Pure and Applied Physics , pp. 1283-1286. https://resolver.caltech.edu/CaltechAUTHORS:20140619-144903064

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Abstract

A laser-interferometer system has been developed to precisely map the thickness variations of large-area silicon detectors. We describe the design and operation of the apparatus and the data processing carried out to derive thickness maps. We compare the results with a map made using accelerator beams of energetic heavy ions.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
http://adsabs.harvard.edu/abs/1995ICRC....4.1283MADSArticle
Additional Information:© IUPAP. Provided by the NASA Astrophysics Data System. We are grateful to R Radocinski and B. Sears for help with the data processing. The research described in this paper was supported by the National Aeronautics and Space Administration at the California Institute of Technology (under contract NAS5-32626 and grant NAGW-1919) and the Jet Propulsion Laboratory. Equipment funding was provided, in part, by the JPL Equipment and Instrumentation Committee.
Group:Space Radiation Laboratory
Funders:
Funding AgencyGrant Number
NASANAS5-32626
NASANAGW-1919
JPL Equipment and Instrumentation CommitteeUNSPECIFIED
Other Numbering System:
Other Numbering System NameOther Numbering System ID
Space Radiation Laboratory1995-33
Record Number:CaltechAUTHORS:20140619-144903064
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20140619-144903064
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:46369
Collection:CaltechAUTHORS
Deposited By: Deborah Miles
Deposited On:10 Jul 2014 03:40
Last Modified:03 Oct 2019 06:43

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