Milliken, B. and Leske, R. A. and Wiedenbeck, M. E.
(1995)
Silicon Detector Studies with an Interferometric Thickness Mapper.
In:
Proceedings of the 24th International Cosmic Ray Conference.
Vol.4.
International Union of Pure and Applied Physics
, pp. 1283-1286.
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Abstract
A laser-interferometer system has been developed to precisely map
the thickness variations of large-area silicon detectors. We describe
the design and operation of the apparatus and the data processing
carried out to derive thickness maps. We compare the results with
a map made using accelerator beams of energetic heavy ions.
| Item Type: | Book Section |
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| Additional Information: | © IUPAP. Provided by the NASA Astrophysics Data System.
We are grateful to R Radocinski and B. Sears for help with the data processing.
The research described in this paper was supported by the National Aeronautics
and Space Administration at the California Institute of Technology (under contract
NAS5-32626 and grant NAGW-1919) and the Jet Propulsion Laboratory. Equipment
funding was provided, in part, by the JPL Equipment and Instrumentation Committee. |
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| Group: | Space Radiation Laboratory |
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| Funders: | | Funding Agency | Grant Number |
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| NASA | NAS5-32626 | | NASA | NAGW-1919 | | JPL Equipment and Instrumentation Committee | UNSPECIFIED |
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| Other Numbering System: | | Other Numbering System Name | Other Numbering System ID |
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| Space Radiation Laboratory | 1995-33 |
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| Record Number: | CaltechAUTHORS:20140619-144903064 |
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| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20140619-144903064 |
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| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
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| ID Code: | 46369 |
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| Collection: | CaltechAUTHORS |
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| Deposited By: |
Deborah Miles
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| Deposited On: | 10 Jul 2014 03:40 |
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| Last Modified: | 09 Mar 2020 13:19 |
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