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Silicon Detector Studies with an Interferometric Thickness Mapper

Milliken, B. and Leske, R. A. and Wiedenbeck, M. E. (1995) Silicon Detector Studies with an Interferometric Thickness Mapper. In: Proceedings of the 24th International Cosmic Ray Conference. Vol.4. International Union of Pure and Applied Physics , pp. 1283-1286.

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A laser-interferometer system has been developed to precisely map the thickness variations of large-area silicon detectors. We describe the design and operation of the apparatus and the data processing carried out to derive thickness maps. We compare the results with a map made using accelerator beams of energetic heavy ions.

Item Type:Book Section
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URLURL TypeDescription
Leske, R. A.0000-0002-0156-2414
Wiedenbeck, M. E.0000-0002-2825-3128
Additional Information:© IUPAP. Provided by the NASA Astrophysics Data System. We are grateful to R Radocinski and B. Sears for help with the data processing. The research described in this paper was supported by the National Aeronautics and Space Administration at the California Institute of Technology (under contract NAS5-32626 and grant NAGW-1919) and the Jet Propulsion Laboratory. Equipment funding was provided, in part, by the JPL Equipment and Instrumentation Committee.
Group:Space Radiation Laboratory
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JPL Equipment and Instrumentation CommitteeUNSPECIFIED
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Space Radiation Laboratory1995-33
Record Number:CaltechAUTHORS:20140619-144903064
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:46369
Deposited By: Deborah Miles
Deposited On:10 Jul 2014 03:40
Last Modified:09 Mar 2020 13:19

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