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Point-Focus X-Ray Monochromators for Low Angle Diffraction

DuMond, Jesse W. M. (1950) Point-Focus X-Ray Monochromators for Low Angle Diffraction. Review of Scientific Instruments, 21 (2). pp. 188-189. ISSN 0034-6748. doi:10.1063/1.1745527.

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Guinier has applied the principle of the reflection type curved crystal focusing x-ray monochromator to improve both intensity and angular resolution in low angle x-ray diffraction studies. In Guinier's method, a thin sample is placed in the convergent monochromatic x-ray beam and the low angle diffraction pattern is formed as a diffuse distribution symmetrically disposed on either side of the central primary line focused by the crystal.

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Additional Information:© 1950 American Institute of Physics. Submitted November 21, 1949.
Issue or Number:2
Record Number:CaltechAUTHORS:20140621-161721666
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:46416
Deposited By: George Porter
Deposited On:23 Jun 2014 15:27
Last Modified:10 Nov 2021 17:25

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