DuMond, Jesse W. M. (1950) Point-Focus X-Ray Monochromators for Low Angle Diffraction. Review of Scientific Instruments, 21 (2). pp. 188-189. ISSN 0034-6748. doi:10.1063/1.1745527. https://resolver.caltech.edu/CaltechAUTHORS:20140621-161721666
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Abstract
Guinier has applied the principle of the reflection type curved crystal focusing x-ray monochromator to improve both intensity and angular resolution in low angle x-ray diffraction studies. In Guinier's method, a thin sample is placed in the convergent monochromatic x-ray beam and the low angle diffraction pattern is formed as a diffuse distribution symmetrically disposed on either side of the central primary line focused by the crystal.
| Item Type: | Article | |||||||||
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| Additional Information: | © 1950 American Institute of Physics. Submitted November 21, 1949. | |||||||||
| Issue or Number: | 2 | |||||||||
| DOI: | 10.1063/1.1745527 | |||||||||
| Record Number: | CaltechAUTHORS:20140621-161721666 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20140621-161721666 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 46416 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | George Porter | |||||||||
| Deposited On: | 23 Jun 2014 15:27 | |||||||||
| Last Modified: | 10 Nov 2021 17:25 |
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