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Energy dispersive x-ray diffraction of charge density waves via chemical filtering

Feng, Yejun and Somayazulu, M. S. and Jaramillo, R. and Rosenbaum, T. F. and Isaacs, E. D. and Hu, Jingzhu and Mao, Ho-kwang (2005) Energy dispersive x-ray diffraction of charge density waves via chemical filtering. Review of Scientific Instruments, 76 (6). Art. No. 063913 . ISSN 0034-6748. doi:10.1063/1.1938954. https://resolver.caltech.edu/CaltechAUTHORS:20140707-163028495

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Abstract

Pressure tuning of phase transitions is a powerful tool in condensed matter physics, permitting high-resolution studies while preserving fundamental symmetries. At the highest pressures, energy dispersive x-ray diffraction (EDXD) has been a critical method for geometrically confined diamond anvil cell experiments. We develop a chemical filter technique complementary to EDXD that permits the study of satellite peaks as weak as 10^(-4) of the crystal Bragg diffraction. In particular, we map out the temperature dependence of the incommensurate charge density wave diffraction from single-crystal, elemental chromium. This technique provides the potential for future GPa pressure studies of many-body effects in a broad range of solid state systems.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1063/1.1938954DOIArticle
http://scitation.aip.org/content/aip/journal/rsi/76/6/10.1063/1.1938954PublisherArticle
ORCID:
AuthorORCID
Feng, Yejun0000-0003-3667-056X
Additional Information:© 2005 American Institute of Physics. Received 17 March 2005; accepted 1 May 2005; published online 10 June 2005. Y.F. would like to acknowledge stimulating discussions with G.T. Seidler and G. Aeppli, and also the great hospitality he received from G. Shen at GSECARS. We thank J. Shu for sample preparation, J. Pluth for sample characterization, and E. Rod and H. Krebs for technical assistance. The work at the University of Chicago was supported by the National Science Foundation under Grant No. DMR-0114798. In addition, R.J. was supported by a NSF Graduate Research Fellowship. Use of the HPCAT facility at APS was supported by DOE-BES, DOE-NNSA (CDAC), NSF, DOD–TACOM, and the W.M. Keck Foundation, and the X17C facility at NSLS was supported by COMPRES.
Funders:
Funding AgencyGrant Number
NSFDMR-0114798
NSF Graduate Research FellowshipUNSPECIFIED
Department of Energy (DOE)UNSPECIFIED
DOD-TACOMUNSPECIFIED
W. M. Keck FoundationUNSPECIFIED
COMPRESUNSPECIFIED
Issue or Number:6
DOI:10.1063/1.1938954
Record Number:CaltechAUTHORS:20140707-163028495
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20140707-163028495
Official Citation:Energy dispersive x-ray diffraction of charge density waves via chemical filtering Feng, Yejun and Somayazulu, M. S. and Jaramillo, R. and Rosenbaum, T. F. and Isaacs, E. D. and Hu, Jingzhu and Mao, Ho-kwang, Review of Scientific Instruments, 76, 063913 (2005), DOI:http://dx.doi.org/10.1063/1.1938954
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:46952
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:09 Jul 2014 15:57
Last Modified:10 Nov 2021 17:32

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