Imaging spectroscopy with the atomic force microscope

Baselt, David R. and Baldeschwieler, John D. (1994) Imaging spectroscopy with the atomic force microscope. Journal of Applied Physics, 76 (1). pp. 33-38. ISSN 0021-8979. doi:10.1063/1.357150. https://resolver.caltech.edu/CaltechAUTHORS:BASjap94

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Abstract

Force curve imaging spectroscopy involves acquiring a force-distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip-sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force on adhesion images.

Item Type:

Article

Related URLs:

URL	URL Type	Description
https://doi.org/10.1063/1.357150	DOI	UNSPECIFIED

Additional Information:

Copyright © 1994 American Institute of Physics. Received 15 November 1993; accepted 5 March 1994. This work was supported in part by a grant from Ford Motor Company and a NSF predoctoral fellowship (D.B.). We thank Topometrix, Inc. for the use of the TMX2000 electronic control unit and its associated computer hardware.

Subject Keywords:

ATOMIC FORCE MICROSCOPY; SPECTROSCOPY; IMAGES; HARDNESS; ADHESION; ELASTICITY

Issue or Number:

DOI:

10.1063/1.357150

Record Number:

CaltechAUTHORS:BASjap94

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https://resolver.caltech.edu/CaltechAUTHORS:BASjap94

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No commercial reproduction, distribution, display or performance rights in this work are provided.

ID Code:

4938

Collection:

CaltechAUTHORS

Deposited By:

Lindsay Cleary

Deposited On:

14 Sep 2006

Last Modified:

08 Nov 2021 20:21

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