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Room-Temperature Cyclic Fatigue of Reaction-Bonded Silicon Nitride Using the Double Cleavage Drilled Compression Specimen

Christensen, Renee J. and Faber, K. T. (1996) Room-Temperature Cyclic Fatigue of Reaction-Bonded Silicon Nitride Using the Double Cleavage Drilled Compression Specimen. Journal of the American Ceramic Society, 79 (2). pp. 425-429. ISSN 0002-7820. http://resolver.caltech.edu/CaltechAUTHORS:20140908-181326842

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Abstract

The double cleavage drilled compression specimen was used to study the room-temperature cyclic fatigue behavior of reaction-bonded silicon nitride (RBSN). Fatigue results were compared with slow crack growth under static loading. The fatigue exponent for RBSN was found to be 40, although no slow crack growth occurred under static loading. The fatigue threshold for RBSN was as low as 0.5/K_(lc) and dependent upon loading conditions. Crack growth behavior and electron microscopy provided evidence that the fatigue mechanism was due to asperity and debris wedging at the crack face.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1111/j.1151-2916.1996.tb08139.xDOIArticle
http://onlinelibrary.wiley.com/doi/10.1111/j.1151-2916.1996.tb08139.x/abstractPublisherArticle
Additional Information:© 1996 The American Ceramic Society. Manuscript No. 193083. Received October 28, 1994: approved January 7, 1995. Presented at the 96th Annual Meeting of the American Ceramic Society, Indianapolis, IN, April 27, 1994 (Fracture, Deformation, and Mechanical Reliability Symposium, Paper No. SXI-48-94). Supported by NIST through the Program for Integrated Design, NDE and Manufacturing Sciences, Award No. 70NANB2H1230. The authors thank Dr. Hongda Cai for his advice on the DCDC specimen.
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Funding AgencyGrant Number
National Institute of Standards and Technology (NIST)70NANB2H1230
Record Number:CaltechAUTHORS:20140908-181326842
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20140908-181326842
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:49422
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:12 Sep 2014 21:49
Last Modified:12 Sep 2014 21:49

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