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Evaluation of Reliability of Brittle Components by Thermal Stress Testing

Johnson-Walls, D. and Drory, M. D. and Evans, A. G. and Marshall, D. B. and Faber, K. T. (1985) Evaluation of Reliability of Brittle Components by Thermal Stress Testing. Journal of the American Ceramic Society, 68 (7). pp. 363-367. ISSN 0002-7820. doi:10.1111/j.1151-2916.1985.tb10143.x.

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A thermal stressing technique was applied to evaluate two distinct flaw populations (surface and corner) in BaTiO_3 multilayer capacitors. The mechanical reliability of the capacitors was deduced by relating the thermal stress response to the mechanical strength of the material. The surface flaw population alone yields relatively high survival probabilities, whereas incorporation of the corner flaw population severely reduces the probability of survival.

Item Type:Article
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Faber, K. T.0000-0001-6585-2536
Additional Information:© 1985 The American Ceramic Society. Received November 20, 1984; revised copy received March 11, 1985; approved March 26, 1985. Support for this work was supplied by the U.S. Office of Naval Research (Contract No. N00014-794-0159) for D.J., M.D.D., and A.G.E., by Rockwell International Research and Development for D.B.M., and by the National Science Foundation (Grant No. DMR-8351476), in conjunction with IBM Corp., Eastman Kodak Co., 3M Co., and PPG Industries, Inc., for K.T.F.
Funding AgencyGrant Number
Office of Naval Research (ONR)N00014-794-0159
Rockwell InternationalUNSPECIFIED
Eastman Kodak CorporationUNSPECIFIED
Issue or Number:7
Record Number:CaltechAUTHORS:20140908-181331116
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:49456
Deposited By: George Porter
Deposited On:11 Sep 2014 18:41
Last Modified:10 Nov 2021 18:44

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