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Glass microstructure characterization by laser light scattering, small angle X-ray scattering and electron microscopy

Rindone, G. E. and Faber, K. T. and Kumar, B. and Olix, W. F. and Sproull, J. F. (1982) Glass microstructure characterization by laser light scattering, small angle X-ray scattering and electron microscopy. Journal of Non-Crystalline Solids, 49 (1-3). pp. 253-262. ISSN 0022-3093. doi:10.1016/0022-3093(82)90123-5.

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Transmission electron microscopy (TEM), small angle X-ray scattering (SAXS) and laser light scattering (LLS) have been used to characterize the microstructures of mixed alkali-lithia-potassia-silica glasses and soda lime silica glasses. In most cases the three methods complement one another very well. In the mixed alkali silicate glasses LLS measurements of particle size correlate very well with TEM measurements. In addition, there is a direct correlation between particle size measurements by both methods and flaw sizes calculated from strength measurements using the Griffith equation. In the soda lime silica system LLS measurements of the glasses prior to heat treatment in the temperature region of metastable liquid immiscibility correlate very well with SAXS measurements of the heat treated glasses. The merits of each method in studies involving these glass systems will be discussed.

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Faber, K. T.0000-0001-6585-2536
Additional Information:Copyright © 1982 Elsevier.
Issue or Number:1-3
Record Number:CaltechAUTHORS:20140908-181331971
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Official Citation:G.E Rindone, K.T Faber, B Kumar, W.F Olix, J.F Sproull, Glass microstructure characterization by lazer light scattering, small angle X-ray scattering and electron microscopy, Journal of Non-Crystalline Solids, Volume 49, Issues 1–3, May 1982, Pages 253-262, ISSN 0022-3093, (
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:49464
Deposited By: George Porter
Deposited On:10 Sep 2014 14:56
Last Modified:10 Nov 2021 18:44

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