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Interface stoichiometry control in ZnO/Cu_2O photovoltaic devices

Wilson, Samantha S. and Tolstova, Yulia and Atwater, Harry A. (2013) Interface stoichiometry control in ZnO/Cu_2O photovoltaic devices. In: IEEE 39th Photovoltaic Specialists Conference. IEEE , Piscataway, NJ, pp. 2410-2413. ISBN 978-1-4799-3299-3.

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Cu_2O is a potential earth-abundant alternative to established thin photovoltaic materials (CIGS, CdTe, etc.) because of its low cost, high availability, and inexpensive processing, but Cu_2O has seen limited development as a photovoltaic device material owing to challenges in measurement and control of interface stoichiometry and doping. We report measurements of Cu_2O interface stoichiometry and the effect of interface composition on heterojunction device performance. ZnO/Cu_2O interface stoichiometry was varied by adjusting the ZnO window layer deposition conditions and stoichiometry was measured by X-ray photoelectron spectroscopy. Current-voltage characteristics of ZnO/Cu_2O heterojunctions indicate open circuit voltages of Voc ~ 530 mV for devices where the Cu_2O layer is stoichiometric at the interface and Voc ~ 100 mV for devices where Cu_2O is nonstoichiometric at the interface.

Item Type:Book Section
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URLURL TypeDescription DOIArticle
Atwater, Harry A.0000-0001-9435-0201
Alternate Title:Interface stoichiometry control in ZnO/Cu2O photovoltaic devices
Additional Information:© 2013 IEEE. The authors acknowledge The Dow Chemical Company for funding and collaborating in this work.
Funding AgencyGrant Number
Dow Chemical CompanyUNSPECIFIED
Subject Keywords:copper compounds, oxygen, photovoltaic cells and semiconductor materials
Record Number:CaltechAUTHORS:20140918-133528703
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Official Citation:Wilson, S.S.; Tolstova, Y.; Atwater, H.A, "Interface stoichiometry control in ZnO/Cu2O photovoltaic devices," Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th , vol., no., pp.2410,2413, 16-21 June 2013 doi: 10.1109/PVSC.2013.6744960 URL:
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:49827
Deposited By: Tony Diaz
Deposited On:18 Sep 2014 21:38
Last Modified:10 Nov 2021 18:48

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