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Interface stoichiometry control to improve device voltage and modify band alignment in ZnO/Cu_2O heterojunction solar cells

Wilson, Samantha S. and Bosco, Jeffrey P. and Tolstova, Yulia and Scanlon, David O. and Watson, Graeme W. and Atwater, Harry A. (2014) Interface stoichiometry control to improve device voltage and modify band alignment in ZnO/Cu_2O heterojunction solar cells. Energy and Environmental Science, 7 (11). pp. 3606-3610. ISSN 1754-5692. doi:10.1039/c4ee01956c. https://resolver.caltech.edu/CaltechAUTHORS:20141001-091528241

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Abstract

The interface stoichiometry of cuprous oxide (Cu_2O) was controlled by adjusting the O_2 and Zn partial pressures during ZnO sputter deposition and measured by high-resolution X-ray photoelectron spectroscopy of ultrathin (<3 nm) ZnO films on Cu_2O. Open-circuit voltage measurements for ZnO/Cu_2O heterojunctions under AM1.5 illumination were measured and it was found that a stoichiometric interface can achieve the voltage entitlement dictated by the band alignment, whereas the non-stoichiometric interface showed large open-circuit voltage deficits. These results highlight not only the need for stoichiometric interfaces in Cu_2O devices, but also a reproducible experimental method for achieving stoichiometric interfaces that could be applied to any potential heterojunction partner. Additionally, valence-band offset measurements indicated changing the interface stoichiometry shifted the band alignment between Cu_2O and ZnO, which accounts for the variation in previously reported band offset values.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1039/c4ee01956cDOIArticle
http://pubs.rsc.org/en/Content/ArticleLanding/2014/EE/C4EE01956CPublisherArticle
ORCID:
AuthorORCID
Atwater, Harry A.0000-0001-9435-0201
Alternate Title:Interface stoichiometry control to improve device voltage and modify band alignment in ZnO/Cu2O heterojunction solar cells
Additional Information:© 2014 The Royal Society of Chemistry. Received 25 Jun 2014, Accepted 28 Aug 2014; First published online 05 Sep 2014. XPS data were collected at the Molecular Materials Research Center of the Beckman Institute of the California Institute of Technology. The authors would like to acknowledge The DOW Chemical Company for funding and collaborating in this work.
Funders:
Funding AgencyGrant Number
Dow Chemical CompanyUNSPECIFIED
Issue or Number:11
DOI:10.1039/c4ee01956c
Record Number:CaltechAUTHORS:20141001-091528241
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20141001-091528241
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:50135
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:09 Oct 2014 22:25
Last Modified:10 Nov 2021 18:52

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