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Seismic model study of refractions from a layer of finite thickness

Press, Frank and Oliver, Jack and Ewing, Maurice (1954) Seismic model study of refractions from a layer of finite thickness. Geophysics, 19 (3). pp. 388-401. ISSN 0016-8033. doi:10.1190/1.1438009.

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Two dimensional model experiments on refractions from layers of finite thickness are described. Refractions can be unreliable for velocity and depth determinations when they occur with wavelengths which are large compared to the layer thickness. Discrepancies reported between refraction velocities and borehole velocities can be partially accounted for in this manner. Even simple two- and three-layer models can show such effects as misleading second arrivals, echeloning of travel time curves, masked layers, and selective absorption in the overburden.

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Additional Information:© 1954 Society of Exploration Geophysicists. Manuscript received by the Editor March 9, 1954. The research reported in this paper was sponsored by the Geophysics Research Division of the Air Force Cambridge Research Center under Contract AF 19(122)441.
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Air Force Cambridge Research Center Geophysical Research DivisionAF 19(122)441
Issue or Number:3
Record Number:CaltechAUTHORS:20141010-093639290
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Official Citation:Frank Press, Jack Ertle Oliver, and William Maurice Ewing Seismic model study of refractions from a layer of finite thickness Geophysics, July 1954, v. 19, p. 388-401, doi:10.1190/1.1438009
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:50333
Deposited By: Tony Diaz
Deposited On:10 Oct 2014 18:45
Last Modified:10 Nov 2021 18:54

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