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Characterization of fast photoelectron packets in weak and strong laser fields in ultrafast electron microscopy

Plemmons, Dayne A. and Park, Sang Tae and Zewail, Ahmed H. and Flannigan, David J. (2014) Characterization of fast photoelectron packets in weak and strong laser fields in ultrafast electron microscopy. Ultramicroscopy, 146 . pp. 97-102. ISSN 0304-3991 . https://resolver.caltech.edu/CaltechAUTHORS:20141024-072837618

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Abstract

The development of ultrafast electron microscopy (UEM) and variants thereof (e.g., photon-induced near-field electron microscopy, PINEM) has made it possible to image atomic-scale dynamics on the femtosecond timescale. Accessing the femtosecond regime with UEM currently relies on the generation of photoelectrons with an ultrafast laser pulse and operation in a stroboscopic pump-probe fashion. With this approach, temporal resolution is limited mainly by the durations of the pump laser pulse and probe electron packet. The ability to accurately determine the duration of the electron packets, and thus the instrument response function, is critically important for interpretation of dynamics occurring near the temporal resolution limit, in addition to quantifying the effects of the imaging mode. Here, we describe a technique for in situ characterization of ultrashort electron packets that makes use of coupling with photons in the evanescent near-field of the specimen. We show that within the weakly-interacting (i.e., low laser fluence) regime, the zero-loss peak temporal cross-section is precisely the convolution of electron packet and photon pulse profiles. Beyond this regime, we outline the effects of non-linear processes and show that temporal cross-sections of high-order peaks explicitly reveal the electron packet profile, while use of the zero-loss peak becomes increasingly unreliable.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://www.sciencedirect.com/science/article/pii/S0304399114001508PublisheraRTICLE
http://dx.doi.org/10.1016/j.ultramic.2014.08.001DOIaRTICLE
Additional Information:© 2014 Elsevier B.V. Received 14 May 2014, Revised 29 July 2014, Accepted 3 August 2014, Available online 10 August 2014. DP and DJF acknowledge support from 3M in the form of a Nontenured Faculty Award (Grant #13673369) and from the Donors of the American Chemical Society Petroleum Research Fund in the form of a Doctoral New Investigator Grant PRF# 53116-DNI7. STP and AHZ acknowledge support from the National Science Foundation and the Air Force Office of Scientific Research in the Center for Physical Biology funded by the Gordon and Betty Moore Foundation.
Funders:
Funding AgencyGrant Number
3M13673369
American Chemical Society Petroleum Research Fund53116-DNI7
NSFUNSPECIFIED
Air Force Office of Scientific Research (AFOSR)UNSPECIFIED
Gordon and Betty Moore FoundationUNSPECIFIED
Subject Keywords:Photon-induced near-field electron microscopy; Instrument response function; Ultrafast electron microscopy
Record Number:CaltechAUTHORS:20141024-072837618
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20141024-072837618
Official Citation:Dayne A. Plemmons, Sang Tae Park, Ahmed H. Zewail, David J. Flannigan, Characterization of fast photoelectron packets in weak and strong laser fields in ultrafast electron microscopy, Ultramicroscopy, Volume 146, November 2014, Pages 97-102, ISSN 0304-3991, http://dx.doi.org/10.1016/j.ultramic.2014.08.001. (http://www.sciencedirect.com/science/article/pii/S0304399114001508)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:50765
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:24 Oct 2014 17:58
Last Modified:03 Oct 2019 07:26

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