Tombrello, T. A. (1992) MeV Ion Implantation in Electronic Materials. In: Materials Modification by Energetic Atoms and Ions. Materials Research Society Symposia Proceedings. No.268. Materials Research Society , Pittsburgh, PA, pp. 273-280. ISBN 978-1558991637. https://resolver.caltech.edu/CaltechAUTHORS:20141029-083721216
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Abstract
Using MeV ions for the modification of electronic materials offers a number of advantages: minimizing surface damage; implantation into completed devices – for example, through contacts or photoresist layers; producing controlled radiation damage for flux pinning where the ions pass completely through the sample and thus do not modify its chemical nature; and enhancing the electronic excitation of the target material versus collisional damage, as in adhesion enhancement processes. In all cases, however, one requires a detailed understanding of the new damage mechanisms that occur and how they can be modified in a controlled way by annealing. In this report I shall present examples from a number of our experiments: resistivity and index of refraction modification in semiconductors; adhesion enhancement; mixing of multilayer structures; and modification of the electronic properties of insulators and superconductors.
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Additional Information: | © 1992 Materials Research Society. Supported in part by the National Science Foundation [Grant DMR90-11230] The work reviewed here has involved the efforts of many people in my group and a large assortment of outside collaborators. Since there are far too many to list here, I direct the reader's attention to the references to the original work that are cited for each example. The funding sources are also as diverse as the coworkers; in addition to the NSF grant listed at the beginning of the article (DMR90-11230], I acknowledge contributions from the NSF's MRG program (DMR88-11795], Lawrence Livermore National Laboratory, Schlumberger-Doll Research, and AT&T Bell Laboratories. | ||||||||||||
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Series Name: | Materials Research Society Symposia Proceedings | ||||||||||||
Issue or Number: | 268 | ||||||||||||
DOI: | 10.1557/PROC-268-273 | ||||||||||||
Record Number: | CaltechAUTHORS:20141029-083721216 | ||||||||||||
Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20141029-083721216 | ||||||||||||
Official Citation: | T. A. Tombrello (1992). MeV Ion Implantation in Electronic Materials. MRS Proceedings, 268, 273 doi:10.1557/PROC-268-273. | ||||||||||||
Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||||||||
ID Code: | 50982 | ||||||||||||
Collection: | CaltechAUTHORS | ||||||||||||
Deposited By: | Ruth Sustaita | ||||||||||||
Deposited On: | 29 Oct 2014 16:17 | ||||||||||||
Last Modified: | 10 Nov 2021 19:03 |
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