Kondo, K. and Ahrens, T. J. and Sawaoka, A. (1982) Electrical and optical measurements on fused quartz under shock compression. In: Shock Waves in Condensed Matter-1981. AIP Conference Proceedings. No.78. American Institute of Physics , New York, NY, pp. 299-303. ISBN 0-88318-177-0. https://resolver.caltech.edu/CaltechAUTHORS:20141031-084124664
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Abstract
The resistivities of specimens of SiO_2 (fused quartz) singly and doubly shocked in the 10 to 45 and 27 to 90 GPa range, respectively, demonstrate a marked decrease from values of ∼10Ω⋅m to ∼0.1Ω⋅m at single shock pressure of ∼40 and double shock pressure of ∼74 GPa. The shock‐induced polarizatio profiles also show a sudden change of electrical properties of the material at those pressures. The rapid decrease in resistivity suggests a further transformation to an unknown phase or production of an electron bound level.
| Item Type: | Book Section | |||||||||
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| Additional Information: | © 1982 American Institute of Physics. Published online 01 April 1982. | |||||||||
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| Series Name: | AIP Conference Proceedings | |||||||||
| Issue or Number: | 78 | |||||||||
| DOI: | 10.1063/1.33328 | |||||||||
| Record Number: | CaltechAUTHORS:20141031-084124664 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20141031-084124664 | |||||||||
| Official Citation: | Electrical and optical measurements on fused quartz under shock compression K. Kondo, T. J. Ahrens and A. Sawaoka AIP Conf. Proc. 78, 299 (1982); http://dx.doi.org/10.1063/1.33328 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 51102 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | Ruth Sustaita | |||||||||
| Deposited On: | 31 Oct 2014 16:15 | |||||||||
| Last Modified: | 10 Nov 2021 19:05 |
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