CaltechAUTHORS
  A Caltech Library Service

Two types of MeV ion beam enhanced adhesion for Au films on SiO_2

Wie, C. R. and Shi, C. R. and Mendenhall, M. H. and Livi, R. P. and Vreeland, T., Jr. and Tombrello, T. A. (1985) Two types of MeV ion beam enhanced adhesion for Au films on SiO_2. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 9 (1). pp. 20-24. ISSN 0168-583X. http://resolver.caltech.edu/CaltechAUTHORS:WIEnimb1985

[img]
Preview
PDF - Published Version
See Usage Policy.

959Kb
[img] PDF - Submitted Version
See Usage Policy.

2681Kb

Use this Persistent URL to link to this item: http://resolver.caltech.edu/CaltechAUTHORS:WIEnimb1985

Abstract

The ion beam-enhanced adhesion of thin Au films on vitreous silica substrates was studied for a wide range of Cl ion beam doses for beam energies between 6.5 MeV and 21.0 MeV. Since the residual adhesion of Au on SiO_2 is low, the improved adhesion can be easily seen using the Scotch Tape Test. The threshold in the enhanced adhesion corresponding to passing the tape test occurs at two different dose ranges for a given energy; one at very low dose centered around 1 × 10^(13) /cm^2, the other at higher doses with a threshold of around 1.5 × 10^(14) /cm^2 (depending upon the beam energy). At low doses (2 × 10^(12) to 5 × 10^(13) /cm^2) surface cracks occur on the SiO_2 substrates, these cracks close up at doses higher than 5 × 10^(13) /cm^2. A possible explanation of enhanced adhesion in the low dose range is associated with the surface crazing of the SiO_2 substrate. To make the adhesion test more quantitative, a scratch test was also used on the samples.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/0168-583X(85)90771-2DOIArticle
http://www.sciencedirect.com/science/article/pii/0168583X85907712PublisherArticle
Alternate Title:Two types of MeV ion beam enhanced adhesion for Au films on SiO2
Additional Information:© 1985 Published by Elsevier B.V. Received 26 June 1984 and in revised form 28 October 1984. Supported in part by the National Science Foundation (DMR-8318274). Brown Bag BB-17
Funders:
Funding AgencyGrant Number
NSFDMR-8318274
Other Numbering System:
Other Numbering System NameOther Numbering System ID
Brown BagBB-17
Record Number:CaltechAUTHORS:WIEnimb1985
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:WIEnimb1985
Official Citation:Wie, C. R., Shi, C. R., Mendenhall, M. H., Livi, R. P., Vreeland Jr, T., & Tombrello, T. A. (1985). Two types of MeV ion beam enhanced adhesion for Au films in SiO2. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 9(1), 20-24. doi: http://dx.doi.org/10.1016/0168-583X(85)90771-2
ID Code:51110
Collection:CaltechAUTHORS
Deposited By: Jason Perez
Deposited On:31 Oct 2014 19:00
Last Modified:20 Jan 2015 22:36

Repository Staff Only: item control page