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Formation of ion damage tracks

Tombrello, T. A. and Wie, C. R. and Itoh, Noriaki and Nakayama, Takeyoshi (1984) Formation of ion damage tracks. Physics Letters A, 100 (1). pp. 42-44. ISSN 0375-9601. https://resolver.caltech.edu/CaltechAUTHORS:20141031-111215736

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Abstract

The formation of damage tracks in insulators from the passage of energetic (MeV/amu) ions indicates that the energy lost by an ion to electronic excitation is partially transferred to atomic motion. It is known that a track consists of localized regions of extended defects that are separated by lengths that exhibit only point defects. The utility of tracks for selective detection of various types of ions arises because of preferential chemical etching along the track as compared to etching the bulk material. In this letter we propose a new model to explain both the localized damage regions and the preferential etching of damage tracks. The formation of each region of extended defects is initiated by the Auger decay of a vacancy produced in an inner electronic shell of an atom of the insulator by the incident ion. This decay produces an intense source of ionization within a small volume around the decaying atom, which causes decomposition of the material in a manner similar to that observed in pulsed laser irradiation. The resulting chemical or crystalline modification of the material is the latent track, which because of its changed structure can be preferentially etched.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/0375-9601(84)90351-7DOIArticle
http://www.sciencedirect.com/science/article/pii/0375960184903517PublisherArticle
Additional Information:© 1984 Elsevier Science Publishers B.V. Received 29 August 1983. One of the authors (T.A.T.) expresses his gratitude to Professor D. Allan Bromley for hospitality shown by the A.W. Wright Nuclear Structure Laboratory at Yale University where this paper was written. This work was supported in part by the NSF [CHE81-13273 and PHY82-15500], NASA [NAGW-202], and the Joint Study Program of the Institute of Molecular Science.
Funders:
Funding AgencyGrant Number
NSFCHE81-13273
NSFPHY82-15500
NASANAGW-202
Institute of Molecular ScienceUNSPECIFIED
Issue or Number:1
Record Number:CaltechAUTHORS:20141031-111215736
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20141031-111215736
Official Citation:Tombrello, T. A., Wie, C. R., Itoh, N., & Nakayama, T. (1984). Formation of ion damage tracks. Physics Letters A, 100(1), 42-44. doi: http://dx.doi.org/10.1016/0375-9601(84)90351-7
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ID Code:51122
Collection:CaltechAUTHORS
Deposited By: Jason Perez
Deposited On:31 Oct 2014 19:01
Last Modified:03 Oct 2019 07:29

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