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Track damage and erosion of insulators by ion-induced electronic processes

Tombrello, T. A. (1984) Track damage and erosion of insulators by ion-induced electronic processes. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2 (1-3). pp. 555-563. ISSN 0168-583X. https://resolver.caltech.edu/CaltechAUTHORS:20141103-100134861

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Abstract

Track damage and the associated ejection of atoms and molecules from insulators, which occur as a result of ion-induced electronic excitation, are of interest both in their own right and because of the mechanisms through which the energy in the excited electrons is transformed into atomic motion. In this paper an overview is given of the phenomena that are observed. We show that there is a remarkable similarity between the damage profile along the ion's track in the solid and the yield of ejected atoms at the energy that corresponds to each point on the track. It is also seen that the density of extended defects (or, correspondingly, the ejected particle yield) appears to have a “universal” form that is weakly dependent on the type of material. In the model presented this is a consequence of the inner-shell ionization of light elements in the solid by the incident ion; the resulting Auger decay produces an intense ionization spike that locally triggers the track formation/erosion process. This model allows the estimation of erosion yields/damage profiles for different ions and materials.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/0168-583X(84)90265-9 DOIArticle
http://www.sciencedirect.com/science/article/pii/0168583X84902659PublisherArticle
Additional Information:© 1984 Elsevier Science Publishers B.V. Supported in part by the NSF (PHY82-15500 and CHE 81-13273) and NASA (NAGW-202). I would like to acknowledge discussions with my colleagues (Peter Haff and Charles Watson) and students (Kelly Cherrey) that have helped me to organize and refine the ideas contained in this paper. Special thanks are also owed to Robert Fleischer who has provided a number of references that were otherwise unknown to the author. I am, in this regard, indebted to Keith Jones and Patrick Richard who helped me to find references to relevant data on K-shell ionization processes. Both Noriaki Itoh and Bo Sundqvist provided essential ideas during the development of this model. Finally, I express my appreciation to Allan Bromley for his hospitality at Yale University, where I have found a peaceful spot to write this paper.
Funders:
Funding AgencyGrant Number
NSFPHY82-15500
NSFCHE 81-13273
NASANAGW-202
Issue or Number:1-3
Record Number:CaltechAUTHORS:20141103-100134861
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20141103-100134861
Official Citation:T.A. Tombrello, Track damage and erosion of insulators by ion-induced electronic processes, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 2, Issues 1–3, March 1984, Pages 555-563, ISSN 0168-583X, http://dx.doi.org/10.1016/0168-583X(84)90265-9. (http://www.sciencedirect.com/science/article/pii/0168583X84902659)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:51166
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:04 Nov 2014 00:00
Last Modified:03 Oct 2019 07:30

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