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Scanning Electron Microscopy and X-Ray Microanalysis [Book Review]

Albee, Arden L. (1982) Scanning Electron Microscopy and X-Ray Microanalysis [Book Review]. Eos, 63 (47). p. 1188. ISSN 0096-3941. http://resolver.caltech.edu/CaltechAUTHORS:20141212-131937251

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Abstract

This outstanding volume has managed the nearly impossible task of combining the expertise of all six authors in a lucid and homogeneous style of writing. Subtitled ‘A Text for Biologists, Material Scientists and Geologists,’ the book has evolved from a short course taught each summer at Lehigh University. The book provides a basic knowledge of (1) the electron optics for these instruments a nd their controls, (2) the characteristics of the electron beam-sample interactions, (3) image formation and interpretation, (4) X ray spectrometry and quantitative X ray microanalysis with separate detailed sections on wavelength dispersive and energy dispersive techniques, and (5) specimen preparation, especially for biological materials.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1029/EO063i047p01188DOIArticle
http://onlinelibrary.wiley.com/doi/10.1029/EO063i047p01188/abstractPublisherArticle
Additional Information:© 1982 American Geophysical Union. Book review of: Scanning Electron Microscopy and X-Ray Microanalysis by J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, and E. Lifshin, Plenum, New York, xii + 673 pp., 1981.
Record Number:CaltechAUTHORS:20141212-131937251
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20141212-131937251
Official Citation:Albee, A. L. (1982), Scanning Electron Microscopy and X-Ray Microanalysis, Eos Trans. AGU, 63(47), 1188–1188, doi:10.1029/EO063i047p01188
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:52768
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:12 Dec 2014 21:24
Last Modified:12 Dec 2014 21:24

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