Albee, Arden L. (1982) Scanning Electron Microscopy and X-Ray Microanalysis [Book Review]. Eos, 63 (47). p. 1188. ISSN 0096-3941. doi:10.1029/EO063i047p01188. https://resolver.caltech.edu/CaltechAUTHORS:20141212-131937251
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Abstract
This outstanding volume has managed the nearly impossible task of combining the expertise of all six authors in a lucid and homogeneous style of writing. Subtitled ‘A Text for Biologists, Material Scientists and Geologists,’ the book has evolved from a short course taught each summer at Lehigh University. The book provides a basic knowledge of (1) the electron optics for these instruments a nd their controls, (2) the characteristics of the electron beam-sample interactions, (3) image formation and interpretation, (4) X ray spectrometry and quantitative X ray microanalysis with separate detailed sections on wavelength dispersive and energy dispersive techniques, and (5) specimen preparation, especially for biological materials.
| Item Type: | Article | |||||||||
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| Additional Information: | © 1982 American Geophysical Union. Book review of: Scanning Electron Microscopy and X-Ray Microanalysis by J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, and E. Lifshin, Plenum, New York, xii + 673 pp., 1981. | |||||||||
| Issue or Number: | 47 | |||||||||
| DOI: | 10.1029/EO063i047p01188 | |||||||||
| Record Number: | CaltechAUTHORS:20141212-131937251 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20141212-131937251 | |||||||||
| Official Citation: | Albee, A. L. (1982), Scanning Electron Microscopy and X-Ray Microanalysis, Eos Trans. AGU, 63(47), 1188–1188, doi:10.1029/EO063i047p01188 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 52768 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | Tony Diaz | |||||||||
| Deposited On: | 12 Dec 2014 21:24 | |||||||||
| Last Modified: | 10 Nov 2021 19:43 |
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