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Metal-semiconductor surface barriers

Mead, C. A. (1966) Metal-semiconductor surface barriers. Solid-State Electronics, 9 (11-12). pp. 1023-1033. ISSN 0038-1101. doi:10.1016/0038-1101(66)90126-2.

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The physical principles underlying the metal-semiconductor barrier are discussed in the light of recent experimental results. A semi-empirical approach for predicting the type of contact to be expected at an arbitrary metal-semiconductor interface is presented.

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Additional Information:Copyright © 1966 Pergamon Press. Received 28 January 1966. Supported in part by the Office of Naval Research under Contract No. Nonr-220 (42) and the International Telephone and Telegraph Company.
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Office of Naval Research (ONR)Nonr-220(42)
International Telephone and Telegraph CompanyUNSPECIFIED
Issue or Number:11-12
Record Number:CaltechAUTHORS:20141217-151530128
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:52985
Deposited On:17 Dec 2014 23:31
Last Modified:10 Nov 2021 19:46

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