Parker, G. H. and McGill, T. C. and Mead, C. A. and Hoffman, D. (1968) Electric field dependence of GaAs Schottky barriers. Solid-State Electronics, 11 (2). pp. 201-204. ISSN 0038-1101. doi:10.1016/0038-1101(68)90079-8. https://resolver.caltech.edu/CaltechAUTHORS:20141217-151846023
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Abstract
The bias dependence of the photoelectric barrier energy of n-GaAs-Al diodes has been measured. The devices were fabricated by cleavage of the GaAs in an evaporating stream of metal in a vacuum of 10^(−8) torr. The barrier energies at various bias levels were determined by extrapolation of the photoresponse vs. photon energy plots. The electric field dependence of the photoresponse was also measured at constant photon energy. The calculated change in barrier energy from the latter method was then compared with the changes in extrapolated values of barrier energy. A small systematic disagreement was observed and attributed to the effects of collection efficiency in the GaAs. The field dependence of Schottky barriers on 5×10^(16) GaAs was found to be in good agreement with that expected from the exponential charge distribution associated with the surface states which determine the barrier energy.
| Item Type: | Article | |||||||||
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| Additional Information: | Copyright © 1968 Pergamon Press. Received 5 August 1967; in revised form 28 September 1967. This work was supported by the Office of Naval Research. | |||||||||
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| Issue or Number: | 2 | |||||||||
| DOI: | 10.1016/0038-1101(68)90079-8 | |||||||||
| Record Number: | CaltechAUTHORS:20141217-151846023 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20141217-151846023 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 52986 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | INVALID USER | |||||||||
| Deposited On: | 17 Dec 2014 23:30 | |||||||||
| Last Modified: | 10 Nov 2021 19:46 |
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