Bozovic, Dolores and Bockrath, M. and Hafner, Jason H. and Lieber, Charles M. and Park, Hongkun and Tinkham, M. (2001) Electronic properties of mechanically induced kinks in single-walled carbon nanotubes. Applied Physics Letters, 78 (23). pp. 3693-3695. ISSN 0003-6951. https://resolver.caltech.edu/CaltechAUTHORS:BOZapl01
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Abstract
We have used an atomic-force microscope tip to mechanically buckle single-walled carbon nanotubes. The resistance of the induced defects ranged from 10 to 100 k Omega and varied with the local Fermi level, as determined by scanned-gate microscopy. By forming two closely spaced defects on metallic nanotubes, we defined quantum dots less than 100 nm in length. These devices exhibited single-electron charging behavior at temperatures up to ~165 K.
| Item Type: | Article |
|---|---|
| Additional Information: | Copyright © 2001 American Institute of Physics. Received 27 December 2000; accepted 9 April 2001. This work was supported in part by NSF Grant Nos. DMR-00-72618, DMR-98-0936, PHY-98-71810, and ONR Grant No. N00014-96-0108, the Dreyfus Foundation, and the Research Corporation (H.P.). |
| Subject Keywords: | carbon nanotubes; atomic force microscopy; crystal defects; Fermi level; quantum dots; quantum interference devices |
| Issue or Number: | 23 |
| Record Number: | CaltechAUTHORS:BOZapl01 |
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:BOZapl01 |
| Alternative URL: | http://dx.doi.org/10.1063/1.1377316 |
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 5352 |
| Collection: | CaltechAUTHORS |
| Deposited By: | Tony Diaz |
| Deposited On: | 13 Oct 2006 |
| Last Modified: | 02 Oct 2019 23:21 |
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