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Electronic properties of mechanically induced kinks in single-walled carbon nanotubes

Bozovic, Dolores and Bockrath, M. and Hafner, Jason H. and Lieber, Charles M. and Park, Hongkun and Tinkham, M. (2001) Electronic properties of mechanically induced kinks in single-walled carbon nanotubes. Applied Physics Letters, 78 (23). pp. 3693-3695. ISSN 0003-6951. https://resolver.caltech.edu/CaltechAUTHORS:BOZapl01

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Abstract

We have used an atomic-force microscope tip to mechanically buckle single-walled carbon nanotubes. The resistance of the induced defects ranged from 10 to 100 k Omega and varied with the local Fermi level, as determined by scanned-gate microscopy. By forming two closely spaced defects on metallic nanotubes, we defined quantum dots less than 100 nm in length. These devices exhibited single-electron charging behavior at temperatures up to ~165 K.


Item Type:Article
Additional Information:Copyright © 2001 American Institute of Physics. Received 27 December 2000; accepted 9 April 2001. This work was supported in part by NSF Grant Nos. DMR-00-72618, DMR-98-0936, PHY-98-71810, and ONR Grant No. N00014-96-0108, the Dreyfus Foundation, and the Research Corporation (H.P.).
Subject Keywords:carbon nanotubes; atomic force microscopy; crystal defects; Fermi level; quantum dots; quantum interference devices
Issue or Number:23
Record Number:CaltechAUTHORS:BOZapl01
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:BOZapl01
Alternative URL:http://dx.doi.org/10.1063/1.1377316
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:5352
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:13 Oct 2006
Last Modified:02 Oct 2019 23:21

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