Mohsen, A. M. and McGill, T. C. and Mead, C. A. (1972) Charge transfer in charge-coupled devices. In: 1972 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. Vol.XV. IEEE , Piscataway, NJ, pp. 248-249. https://resolver.caltech.edu/CaltechAUTHORS:20150114-110748689
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Abstract
Previous theoretical work on the operation of charge-coupled devices has been rather qualitative. These studies emphasize one of a number of factors which can influence the charge-transfer process, for example, nonlinear diffusion and fringing fields. However, none of these studies take account of all the factors in a realistic way.
| Item Type: | Book Section | |||||||||
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| Additional Information: | © 1972 IEEE. | |||||||||
| DOI: | 10.1109/ISSCC.1972.1155057 | |||||||||
| Record Number: | CaltechAUTHORS:20150114-110748689 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20150114-110748689 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 53706 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | INVALID USER | |||||||||
| Deposited On: | 14 Jan 2015 20:39 | |||||||||
| Last Modified: | 10 Nov 2021 20:06 |
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