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Stereographic X-ray reflection topography of dislocations in zinc

Vreeland, T., Jr. (1976) Stereographic X-ray reflection topography of dislocations in zinc. Journal of Applied Crystallography, 9 (1). pp. 34-38. ISSN 0021-8898. https://resolver.caltech.edu/CaltechAUTHORS:20150123-130239768

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Abstract

X-ray reflection topographs were taken of a zinc surface oriented about 1° from a basal plane. Basal dislocations are revealed in the topographs, and their apparent depth was determined using stereo pairs of topographs. The apparent depths observed in a complimentary pair of topographs using 1013 and 1013 reflections were significantly greater than those observed in an asymmetric pair of topographs in which the same 1013 reflection was used. This difference is attributed to shifts of the image with respect to the dislocation position. Quantitative estimates of the image shifts and the actual depths of the observed dislocations are obtained from the measurement of apparent depths. Dislocations are visible over the range of depths from 1.7 to 4.5 µm.


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Additional Information:© 1976 International Union of Crystallography. This work was sponsored by the National Science Foundation and by a grant from the President's Fund of the California Institute of Technology. The work of A. Illig on specimen preparation and photography is gratefully acknowledged. The author expresses his thanks to R. H. Selzer and S. Harami of the Jet Propulsion Laboratory for the image-processing work of this study, and to Professor R. E. Villagrana for many helpful discussions throughout the course of this work. Mr. Lawrence Tu's assistance during the initial stages of this work is also gratefully acknowledged.
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Deposited By: Tony Diaz
Deposited On:23 Jan 2015 22:32
Last Modified:03 Oct 2019 07:54

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