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Transistor switching analysis Part 1

Mead, C. A. (1960) Transistor switching analysis Part 1. Semiconductor Products, 3 (9). pp. 43-47. ISSN 0096-4034. http://resolver.caltech.edu/CaltechAUTHORS:20150128-161929182

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Abstract

With the widespread application of junction transistors in switching applications, the need for a general method of analysis useful in the region of collector voltage saturation has become apparent. Linear equivalent circuits using lumped elements have long been used for small signal calculations of normally biased transistors, but a comparable method for saturated transistors has been lacking. Recently Linvill proposed the method of lumped models which allow the analysis of complex switching problems with the case of linear circuit calculations. The method is shown to be equivalent to a well-known linear equivalent circuit under normal bias conditions. Examples of the application of the method and the use of approximations are drawn from practical circuit problems. Emphasis is placed upon the understanding of the physical phenomena involved, a necessary prerequisite to intelligent circuit design.


Item Type:Article
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http://resolver.caltech.edu/CaltechAUTHORS:20150128-162326627Related ItemPart 2
http://resolver.caltech.edu/CaltechAUTHORS:20150128-162613453Related ItemPart 3
Additional Information:© 1960 Cowan Publishing.
Record Number:CaltechAUTHORS:20150128-161929182
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20150128-161929182
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:54202
Collection:CaltechAUTHORS
Deposited By: Kristin Buxton
Deposited On:29 Jan 2015 04:05
Last Modified:25 Oct 2016 17:21

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