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Photoemissive Determination of Barrier Shape in Tunnel Junctions

Braunstein, A. and Braunstein, M. and Picus, G. S. and Mead, C. A. (1965) Photoemissive Determination of Barrier Shape in Tunnel Junctions. Physical Review Letters, 14 (7). pp. 219-221. ISSN 0031-9007. doi:10.1103/PhysRevLett.14.219.

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Tunnel junctions have been characterized in terms of three parameters, the barrier heights φ_1, and φ_2, and the width S, which generally are determined by a fit of experimental current-voltage characteristic curves with theory. In metal-semiconductor systems barrier heights have been determined independently of other parameters from measurement of the spectral dependence of photoresponse. We wish to report the first results of the application of this technique to the measurement of the barrier heights in Al-Al_2O_3-A1 and Al-A1_20_3—Au tunnel junctions where the Al_2O_3 thickness is in the range of 20 to 40 Å .

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Additional Information:© 1965 American Physical Society. Received 6 January 1965.
Issue or Number:7
Record Number:CaltechAUTHORS:20150130-152013585
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:54258
Deposited On:31 Jan 2015 23:19
Last Modified:10 Nov 2021 20:31

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