Materials Research Activities

STM calibration

STM calibration

During the early phase of STM (before the 1986 Nobel Prize award) calibration of the piezo was essential. This means that one needs to know the changes in the x, y, and z position of the tip caused by adjustments to the piezo on which the tip is mounted. Just how this was done still needs to be investigated (comments welcome!). Once the STM was established this problem vanished. For example, commercial STMs supplied by Digital Instruments in 1989 simply used the STM measurements of atomic distance in a known crystal as the benchmark. This is a sign of robustness and of widespread trust in the STM by the year 1989. The same calibrative scheme would not have worked half a dozen years earlier because many scientists did not then trust S\TM measurements; they thought that they were effects of the instrument itself, or indeed fraudulent.

(Sources: Elings & Gurley (Digital Instruments Inc.), "STM in Research and Development", Research & Development, February 1989, 126-129)

This page was written and last updated on 16-Feb-2001 by Arne Hessenbruch.