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Structural Characterization of HgTe/Cd/Te Superlattices

Paine, B. M. and Vreeland, T., Jr. and Cheung, J. T. (1986) Structural Characterization of HgTe/Cd/Te Superlattices. In: Layered Structures and Epitaxy. Materials Research Society Symposia Proceedings. No.56. Materials Research Society , Pittsburgh, PA, pp. 313-319. ISBN 9780931837210. https://resolver.caltech.edu/CaltechAUTHORS:20150210-085506576

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Abstract

Superlattices of HgTe and CdTe, grown on (100) and (111) CdTe, have been characterized by He ion backscattering spectrometry and x-ray double crystal diffractometry. Backscattering spectrometry gave basic information about the depth-distribution of layers, i.e. the number of layers in the superlattice, the thickness of CdTe overlayer and the location of damage in the underlying CdTe. Symmetric and asymmetric rocking curves gave information about crystal quality and layer thicknesses. Average strains in the directions perpendicular and parallel to the layer interfaces were obtained directly from the rocking curves. Strains and thicknesses of the HgTe and CdTe layers, as well as variations from layer to layer, were found by fitting the symmetric rocking curves with theoretical calculations based on a kinematic model for the diffraction. A tilt of the atomic planes in the epitaxial layers, relative to those in the substrate, was observed by means of rocking curves recorded from the same diffracting planes, but with reversed incident and diffracted beam directions.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1557/PROC-56-313DOIArticle
http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=8190841&fileId=S194642740058230XPublisherArticle
Additional Information:© 1986 Materials Research Society. This work was supported financially by the Office of Naval Research (Contract No. N00014-83-C-0736).
Funders:
Funding AgencyGrant Number
Office of Naval Research (ONR)N00014-83-C-0736
Series Name:Materials Research Society Symposia Proceedings
Issue or Number:56
Record Number:CaltechAUTHORS:20150210-085506576
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20150210-085506576
Official Citation:B. M. PAINE, T. VREELAND and J. T. CHEUNG (1985). STRUCTURAL CHARACTERIZATION OF HgTe/CdTe SUPERLATTICES. MRS Proceedings, 56, 313 doi:10.1557/PROC-56-313.
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:54632
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:10 Feb 2015 23:57
Last Modified:03 Oct 2019 07:59

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