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The Mobility of Edge Dislocations in Pure Copper Single Crystals

Jassby, K. M. and Vreeland, T., Jr. (1969) The Mobility of Edge Dislocations in Pure Copper Single Crystals. . (Unpublished) https://resolver.caltech.edu/CaltechAUTHORS:20150211-103245777

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Abstract

The velocity of selectively introduced edge dislocations in 99.999 percent pure copper crystals has been measured as a function of stress at temperatures from 66°K to 373°K by means of the torsion technique developed by Pope, Vreeland, and Wood (1967). The range of resolved shear stress was 0 to 15 megadynes/cm^2 for seven temperatures (66°K, 74°K, 83°K, 123°K, 173°K, 296°K, 373°K). The path of motion of individually displaced dislocations was traced from Berg-Barrett x-ray micrographs, while the etch pit technique was used to indicate the crossing of forest dislocations. The test crystals were free from substructure with a grown-in dislocation density between 10^3 and 10^4 cm/cm^3. The dislocations were between 0.01 and 0.02 cm in length and displacements varied between 0 and 0.1 cm, so that in the extreme case the intersection of forest dislocations was reduced to zero.


Item Type:Report or Paper (Technical Report)
Additional Information:This work was sponsored by the U.S. Atomic Energy Commission. To be presented at the International Conference on The Quantitative Relation Between Properties and Microstructure, Haifa, Israel, July 27, 1969. CALT-767-P3-5.
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CALT767-P3-5
Record Number:CaltechAUTHORS:20150211-103245777
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20150211-103245777
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:54715
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:11 Feb 2015 20:15
Last Modified:03 Oct 2019 08:00

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