Pope, D. P. and Vreeland, T., Jr. (1969) Basal Dislocation Density Measurements in Zinc. Transactions of the Metallurgical Society of AIME, 245 (11). pp. 2447-2449. ISSN 0543-5722. https://resolver.caltech.edu/CaltechAUTHORS:20150304-124225961
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Abstract
Observations of dislocations in zinc using Berg-Barrett X-ray micrography confirm the validity of a dislocation etch for {1010} surfaces. A technique for measurement of the depth in which dislocations can be imaged in X-ray micrographs is given. This depth on (0001) surfaces of zinc was found to be 2.5 µ using a (1013) reflection and CoKα radiation.
Item Type: | Article | ||||
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Additional Information: | © 1969 American Institute of Mining, Metallurgical, and Petroleum Engineers. Manuscript submitted April 14, 1969. This work was sponsored by the U.S. Atomic Energy Commission. | ||||
Funders: |
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Issue or Number: | 11 | ||||
Record Number: | CaltechAUTHORS:20150304-124225961 | ||||
Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20150304-124225961 | ||||
Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||
ID Code: | 55518 | ||||
Collection: | CaltechAUTHORS | ||||
Deposited By: | Tony Diaz | ||||
Deposited On: | 04 Mar 2015 20:50 | ||||
Last Modified: | 03 Oct 2019 08:06 |
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