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Diffracted beam-transmitted beam Borrmann X-ray topography in copper. A novel method of stereo depth topography

Hamill, G. P. and Vreeland, T., Jr. (1979) Diffracted beam-transmitted beam Borrmann X-ray topography in copper. A novel method of stereo depth topography. Journal of Applied Crystallography, 12 (4). pp. 346-350. ISSN 0021-8898. http://resolver.caltech.edu/CaltechAUTHORS:20150305-074514002

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Abstract

The observed depths of dislocations, as measured from the exit surface of a copper single-crystal, are within a region of the crystal where µd, the kinematic linear absorption coefficient times the depth, is less than or approximately equal to unity. Splitting of the Borrmann wave into its diffracted and transmitted beam components is indicated in relatively perfect portions of the crystal near the exit surface.


Item Type:Article
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http://dx.doi.org/10.1107/S0021889879012668DOIArticle
http://scripts.iucr.org/cgi-bin/paper?a18177PublisherArticle
Additional Information:© 1979 International Union of Crystallography. The research was supported by the National Science Foundation and by a grant from the research office of the Department of the Army. Dr Hamill wishes to express his thanks to the California Institute of Technology for research and teaching assistantships. The work of A. Illig on specimen preparation and photography is gratefully acknowledged.
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Department of the ArmyUNSPECIFIED
Record Number:CaltechAUTHORS:20150305-074514002
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20150305-074514002
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:55528
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Deposited By: Tony Diaz
Deposited On:05 Mar 2015 22:34
Last Modified:05 Mar 2015 22:34

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