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Computer Enhancement of Weak-Beam Images

Horgen, H. M. and Villagrana, R. E. and Maher, D. M. (1969) Computer Enhancement of Weak-Beam Images. . https://resolver.caltech.edu/CaltechAUTHORS:20150305-101206985

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Abstract

In order to perform quantitative image-contrast analysis of low-contrast electron micrographs one must first increase the signal to noise ratio. As an example, consider the weak-beam method ' of imaging defects by transmission electron microscopy. In this technique an increase in the resolution of closely spaced dislocations is obtained through a narrowing of the individual dislocation image widths. However, this reduction in image width is accompanied by a corresponding decrease in the signal to noise ratio, which in many instances renders quantitative image-contrast analysis impractical. In this note we present an example of the computer image enhancement of a weak-beam micrograph.


Item Type:Report or Paper (Technical Report)
Additional Information:This investigation was sponsored by the U.S. Atomic Energy Commission. CALT-767-P3-32.
Funders:
Funding AgencyGrant Number
Atomic Energy CommissionUNSPECIFIED
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Other Numbering System NameOther Numbering System ID
CALT767-P3-32
Record Number:CaltechAUTHORS:20150305-101206985
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20150305-101206985
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:55537
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:05 Mar 2015 22:22
Last Modified:03 Oct 2019 08:06

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