Horgen, H. M. and Villagrana, R. E. and Maher, D. M. (1969) Computer Enhancement of Weak-Beam Images. . https://resolver.caltech.edu/CaltechAUTHORS:20150305-101206985
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Abstract
In order to perform quantitative image-contrast analysis of low-contrast electron micrographs one must first increase the signal to noise ratio. As an example, consider the weak-beam method ' of imaging defects by transmission electron microscopy. In this technique an increase in the resolution of closely spaced dislocations is obtained through a narrowing of the individual dislocation image widths. However, this reduction in image width is accompanied by a corresponding decrease in the signal to noise ratio, which in many instances renders quantitative image-contrast analysis impractical. In this note we present an example of the computer image enhancement of a weak-beam micrograph.
Item Type: | Report or Paper (Technical Report) | ||||
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Additional Information: | This investigation was sponsored by the U.S. Atomic Energy Commission. CALT-767-P3-32. | ||||
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Record Number: | CaltechAUTHORS:20150305-101206985 | ||||
Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20150305-101206985 | ||||
Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||
ID Code: | 55537 | ||||
Collection: | CaltechAUTHORS | ||||
Deposited By: | Tony Diaz | ||||
Deposited On: | 05 Mar 2015 22:22 | ||||
Last Modified: | 03 Oct 2019 08:06 |
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