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The Effect of Cathode Bias (Field Effect) on the Surface Leakage Current of CdZnTe Detectors

Bolotnikov, A. E. and Chen, C. M. Hubert and Cook, W. R. and Harrison, F. A. and Kuvvetli, I. and Schindler, S. M. and Stahle, C. M. and Parker, B. H. (2003) The Effect of Cathode Bias (Field Effect) on the Surface Leakage Current of CdZnTe Detectors. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 510 (3). pp. 300-308. ISSN 0168-9002. http://resolver.caltech.edu/CaltechAUTHORS:20150320-161137698

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Abstract

Surface resistivity is an important parameter of multi-electrode CZT detectors such as coplanar-grid, strip, or pixel detectors. Low surface resistivity results in a high leakage current and affects the charge collection efficiency in the areas near contacts. Thus, it is always desirable to have the surface resistivity of the detector as high as possible. In the past the most significant efforts were concentrated to develop passivation techniques for CZT detectors. However, as we found, the field-effect caused by a bias applied on the cathode can significantly reduce the surface resistivity even though the detector surface was carefully passivated. In this paper we illustrate that the field-effect is a common feature of the CZT multi-electrode detectors, and discuss how to take advantage of this effect to improve the surface resistivity of CZT detectors.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/S0168-9002(03)01730-3 DOIArticle
http://www.sciencedirect.com/science/article/pii/S0168900203017303PublisherArticle
ORCID:
AuthorORCID
Harrison, F. A.0000-0003-2992-8024
Additional Information:© 2003 Published by Elsevier Science B.V. Received 18 March 2003; accepted 30 April 2003. This work was supported by NASA under the grant No. NAG5-5289. The authors wish to thank K. Parhnam and C. Szeles from eV-Products, Inc. for fruitful discussions.
Group:Space Radiation Laboratory
Funders:
Funding AgencyGrant Number
NASANAG5-5289
Subject Keywords:CdZnTe; field-effect; pixel detectors
Other Numbering System:
Other Numbering System NameOther Numbering System ID
Space Radiation Laboratory2003-59
Record Number:CaltechAUTHORS:20150320-161137698
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20150320-161137698
Official Citation:A.E. Bolotnikov, C.M. Hubert Chen, W.R. Cook, F.A. Harrison, I. Kuvvetli, S.M. Schindler, C.M. Stahle, B.H. Parker, The effect of cathode bias (field effect) on the surface leakage current of CdZnTe detectors, Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Volume 510, Issue 3, 11 September 2003, Pages 300-308, ISSN 0168-9002, http://dx.doi.org/10.1016/S0168-9002(03)01730-3. (http://www.sciencedirect.com/science/article/pii/S0168900203017303)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:55953
Collection:CaltechAUTHORS
Deposited By: Deborah Miles
Deposited On:24 Mar 2015 16:17
Last Modified:10 Oct 2017 23:42

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