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Diffraction-Assisted Image Correlation for Three-Dimensional Surface Profiling

Pan, Z. and Xia, S. and Gdoutou, A. and Ravichandran, G. (2015) Diffraction-Assisted Image Correlation for Three-Dimensional Surface Profiling. Experimental Mechanics, 55 (1). pp. 155-165. ISSN 0014-4851.

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The recently developed Diffraction-Assisted Image Correlation (DAIC) method (Xia et al. Exp Mech 53(5):755–765, 2013) provides a simple and accurate means for three-dimensional (3D) full-field deformation measurement. In the DAIC method, a test specimen is viewed through a transmission diffraction grating, resulting in multiple diffracted views of the same specimen that encode 3D geometric information. Here, we extend the original DAIC method to permit quantitative measurement of 3D surface profiles. We show, through a pinhole projection model, that the 3D shape of an object surface can be reconstructed by simply performing two-dimensional digital image correlation (2D-DIC) analysis between the negative and positive first-order diffracted views. Test results on a Barbie doll’s face and a set of well-defined cylindrical, conical and step surfaces are presented to illustrate the implementation and performance of the proposed surface profiling method.

Item Type:Article
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Ravichandran, G.0000-0002-2912-0001
Additional Information:© 2014 Society for Experimental Mechanics. Received: 17 October 2013; Accepted: 19 June 2014; Published online: 15 August 2014. S.X. and Z.P. gratefully acknowledge the support of the Haythornthwaite Foundation.
Funding AgencyGrant Number
Haythornthwaite FoundationUNSPECIFIED
Subject Keywords:Digital image correlation; Diffraction; Surface profile measurement; Image distortion calibration
Issue or Number:1
Record Number:CaltechAUTHORS:20150402-134407182
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Official Citation:Pan, Z., Xia, S., Gdoutou, A. et al. Exp Mech (2015) 55: 155. doi:10.1007/s11340-014-9918-7
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:56312
Deposited By: Tony Diaz
Deposited On:02 Apr 2015 20:58
Last Modified:09 Mar 2020 13:19

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