CaltechAUTHORS
  A Caltech Library Service

Application of in-situ nano-scanning calorimetry and X-ray diffraction to characterize Ni–Ti–Hf high-temperature shape memory alloys

McCluskey, Patrick J. and Xiao, Kechao and Gregoire, John M. and Dale, Darren and Vlassak, Joost J. (2015) Application of in-situ nano-scanning calorimetry and X-ray diffraction to characterize Ni–Ti–Hf high-temperature shape memory alloys. Thermochimica Acta, 603 . pp. 53-62. ISSN 0040-6031. http://resolver.caltech.edu/CaltechAUTHORS:20150416-095057322

Full text is not posted in this repository. Consult Related URLs below.

Use this Persistent URL to link to this item: http://resolver.caltech.edu/CaltechAUTHORS:20150416-095057322

Abstract

Combinatorial nanocalorimetry and synchrotron X-ray diffraction were combined to study the martensite–austenite (M–A) phase transformation behavior of Ni–Ti–Hf shape memory alloys. A thin-film library of Ni–Ti–Hf samples with a range of compositions was deposited on a parallel nano-scanning calorimeter device using sputter deposition. Crystallization of each amorphous as-deposited sample by local heating at approximately 10^4 K/s produced a nanoscale grain structure of austenite and martensite. Individual samples were then cycled through the M–A transformation, while the transformation enthalpy was measured by nanocalorimetry and the low- and high-temperature phase compositions were determined by X-ray diffraction. The techniques enable correlation of the observed behavior during thermal cycling with the thermodynamic and structural properties of the samples.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/j.tca.2014.07.023DOIArticle
http://www.sciencedirect.com/science/article/pii/S0040603114003517PublisherArticle
ORCID:
AuthorORCID
Gregoire, John M.0000-0002-2863-5265
Additional Information:© 2014 Elsevier B.V. Available online 4 August 2014. The authors thank Aaron Lyndaker for assistance with the synchrotron experiments and James MacArthur for assistance with the custom electronics. The work presented in this paper was supported by the Air Force Office of Scientific Research under Grants FA9550-08-1-0374 and A9550-12-1-0098, and by the Materials Research Science and Engineering Center at Harvard University. It was performed in part at the Center for Nanoscale Systems, a member of the National Nanotechnology Infrastructure Network, which is supported by the National Science Foundation under NSF Award ECS-0335765. The Center for Nanoscale Systems is part of the Faculty of Arts and Sciences at Harvard University.
Funders:
Funding AgencyGrant Number
Air Force Office of Scientific Research (AFOSR)FA9550-08-1-0374
Air Force Office of Scientific Research (AFOSR)FA9550-12-1-0098
Harvard UniversityUNSPECIFIED
NSFECS-0335765
Subject Keywords:Nanocalorimetry; Synchrotron X-ray diffraction; Shape memory alloy; High-throughput; Combinatorial
Record Number:CaltechAUTHORS:20150416-095057322
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20150416-095057322
Official Citation:Patrick J. McCluskey, Kechao Xiao, John M. Gregoire, Darren Dale, Joost J. Vlassak, Application of in-situ nano-scanning calorimetry and X-ray diffraction to characterize Ni–Ti–Hf high-temperature shape memory alloys, Thermochimica Acta, Volume 603, 10 March 2015, Pages 53-62, ISSN 0040-6031, http://dx.doi.org/10.1016/j.tca.2014.07.023. (http://www.sciencedirect.com/science/article/pii/S0040603114003517)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:56718
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:16 Apr 2015 17:54
Last Modified:17 Aug 2017 04:07

Repository Staff Only: item control page