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Resonance ionization of sputtered atoms-progress toward a quantitative technique

Calaway, W. F. and Coon, S. R. and Pellin, M. J. and Young, C. E. and Whitten, J. E. and Wiens, R. C. and Gruen, D. M. and Stingeder, G. and Penka, V. and Grasserbauer, M. and Burnett, D. S. (1992) Resonance ionization of sputtered atoms-progress toward a quantitative technique. In: Resonance Ionization Spectroscopy 1992. Vol.128. IOP , pp. 271-274. ISBN 0-7503-0230-5.

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The combination of RIMS and ion sputtering has been heralded as the ideal means of quantitatively probing the surface of a solid. While several laboratories have demonstrated the extreme sensitivity of combining RIMS with sputtering, less effort has been devoted to the question of accuracy. Using the SARISA instrument developed at Argonne National Laboratory, a number of well-characterized metallic samples have been analyzed. Results from these determinations have been compared with data obtained by several other analytical methods. One significant finding is that impurity measurements down to ppb levels in metal matrices can be made quantitative by employing polycrystalline metal foils as calibration standards. This discovery substantially reduces the effort required for quantitative analysis since a single standard can be used for determining concentrations spanning nine orders of magnitude.

Item Type:Book Section
Related URLs:
URLURL TypeDescription
Wiens, R. C.0000-0002-3409-7344
Gruen, D. M.0000-0003-3270-7644
Burnett, D. S.0000-0001-9521-8675
Additional Information:© 1992 IOP Publishing Ltd and individual contributors. Work supported by the U.S. Department of Energy, BES-Materials Sciences, under Contract W-31-109-ENG-38.
Group:UNSPECIFIED, Division of Geological and Planetary Sciences
Funding AgencyGrant Number
Department of Energy (DOE)W-31-109-ENG-38
Record Number:CaltechAUTHORS:20150506-130239979
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:57281
Deposited By: Ruth Sustaita
Deposited On:08 May 2015 04:57
Last Modified:12 Jul 2022 19:49

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