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Microstructural changes and in-situ observation of localization in OFHC copper under dynamic loading

Bodelot, Laurence and Escobedo-Diaz, Juan P. and Trujillo, Carl P. and Martinez, Daniel T. and Cerreta, Ellen K. and Gray, George T., III and Ravichandran, Guruswami (2015) Microstructural changes and in-situ observation of localization in OFHC copper under dynamic loading. International Journal of Plasticity, 74 . pp. 58-74. ISSN 0749-6419. https://resolver.caltech.edu/CaltechAUTHORS:20150714-104554909

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Abstract

In this paper, we introduce an original experimental protocol that couples microstructural analyses before and after deformation to in-situ grain scale strain measurements in OFHC copper samples during dynamic loading. This analysis is conducted on a modified shear compression specimen (SCS) that exhibits localization within a flat gage section and hence lends itself to ultra-high-speed imaging of the localization evolution. We were thus able to study the influence of the microstructure on strain localization as well as the process of localization in OFHC copper submitted to high-strain rate loading at different rates. We found that in the case of these modified perforated SCS samples, the early stages of localization were geometry driven while grain size and strain-rate dependency only emerged later. For the two smallest grain sizes examined here, a stronger strain-rate dependency was observed. This led to a narrower and more elongated localization of the highest strains at the local scale and to a concurrent harder macroscopic response at higher strain rate. For the largest grain size examined here, the macroscopic response was nearly identical at both strain rates but largely softer than for the smaller grain sizes. This translated into a wider localization pattern in the local strain fields compensating for lower values of maximum local strain. Texture evolution was strongly grain-size-dependent as smaller grain-size samples showed very mild lattice rotation accompanied with dynamic recrystallization into smaller grains, while the large grain-size samples showed a marked texture formation accompanied with both grain growth and stress relaxation phenomena. The introduced experimental protocol can thus give access to data providing new insight into microstructural aspects of localization under dynamic loading; such data is additionally relevant for validating multiscale or crystal plasticity models for dynamic applications.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/j.ijplas.2015.06.002DOIArticle
http://www.sciencedirect.com/science/article/pii/S0749641915000984PublisherArticle
ORCID:
AuthorORCID
Ravichandran, Guruswami0000-0002-2912-0001
Additional Information:© 2015 Elsevier Ltd. Received 9 September 2014; Received in revised form 24 May 2015; Available online 25 June 2015. This paper is based upon work supported by the Department of Energy National Nuclear Security Administration under Award Number DE-FC52-08NA28613, which is gratefully acknowledged. The authors thank Brad St. John, Joe Haggerty and Ali Kiani from GALCIT for machining the SCS samples, as well as Mike Lopez from MST-8 Division in LANL for his technical advice. LB and CT also acknowledge the support of Todd Rumbaugh from Highland Imaging for providing the Shimadzu camera.
Group:GALCIT
Funders:
Funding AgencyGrant Number
Department of Energy (DOE) National Nuclear Security AdministrationDE-FC52-08NA28613
Subject Keywords:A. Dynamics; B. Polycrystalline material; C. Electron microscopy; C. Kolsky bar; Ultra-high-speed imaging
Record Number:CaltechAUTHORS:20150714-104554909
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20150714-104554909
Official Citation:Laurence Bodelot, Juan P. Escobedo-Diaz, Carl P. Trujillo, Daniel T. Martinez, Ellen K. Cerreta, George T. Gray III, Guruswami Ravichandran, Microstructural changes and in-situ observation of localization in OFHC copper under dynamic loading, International Journal of Plasticity, Volume 74, November 2015, Pages 58-74, ISSN 0749-6419, http://dx.doi.org/10.1016/j.ijplas.2015.06.002. (http://www.sciencedirect.com/science/article/pii/S0749641915000984)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:58877
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:15 Jul 2015 00:02
Last Modified:09 Mar 2020 13:19

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