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Energy loss of low energy protons channeling in silicon crystals

Melvin, J. D. and Tombrello, T. A. (1975) Energy loss of low energy protons channeling in silicon crystals. Radiation Effects, 26 (1-2). pp. 113-126. ISSN 0033-7579.

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Experimental energy loss measurements were made for protons of energy 0.5 to 1.6 MeV channeling through 1 μm thick silicon targets along the (110), (111), and (211) axial directions, and the {100}, {110}, {111}, and {211} planar directions. These data have a precision of ±5% and are presented graphically along with an extensive summary of other data in the literature. The new data cover a wider range of channels than has previously been examined with protons and are in agreement with the helium data of Eisen et al. A standard theory of energy loss is summarized and amplified, and straggling is calculated theoretically. Local electron densities for various channels in silicon are extracted from plane and row averaged Thomas Fermi potentials via ▿^2 V = 4 πρ, and are used in the theoretical energy loss and straggling equations. The results agree with the experimental data to within 5%. The need for more precise measurements in order to make a decisive test of the theory is discussed.

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Additional Information:© 1975 Gordon and Breach Science Publishers Ltd. Received January 13, 1975. Supported in part by the National Science Foundation [GP-28027]. The authors wish to express their appreciation to Frederick Eisen for his invaluable experimental suggestions and excellent targets used in our experiments, and to James Mayer for his constant willingness to provide guidance and help. One of us (JDM) wants to extend his deep thanks to his family - to Sophia, Mael and Paul, to Betty and all of his California family, and especially to Rosie-for their constant help and encouragement.
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Issue or Number:1-2
Record Number:CaltechAUTHORS:20150729-155845223
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:59082
Deposited By: Tony Diaz
Deposited On:06 Aug 2015 19:21
Last Modified:03 Oct 2019 08:43

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