A Caltech Library Service

Scanning Electrical Mobility Spectrometer

Wang, Shih Chen and Flagan, Richard C. (1990) Scanning Electrical Mobility Spectrometer. Aerosol Science and Technology, 13 (2). pp. 230-240. ISSN 0278-6826. doi:10.1080/02786829008959441.

Full text is not posted in this repository. Consult Related URLs below.

Use this Persistent URL to link to this item:


The measurement of particle size distributions using electrical mobility can be accelerated significantly by an alternate mode of operating mobility instruments. Rather than changing the electric field in discrete steps to select particles in a given mobility range, the electric field can be scanned continuously. The particles are classified in a time-varying electric field, but for an exponential ramp in the field strength there remains a one-to-one correspondence between the time a particle enters the classifier and the time it leaves. By this method, complete scans of mobility with as many as 100 mobility measurements have been made in 30 seconds using a differential mobility classifier with a condensation nuclei counter as a detector.

Item Type:Article
Related URLs:
URLURL TypeDescription
Flagan, Richard C.0000-0001-5690-770X
Additional Information:© 1990 Elsevier Science Publishing Co., Inc. Received 31 March 1989; accepted 20 November 1989. The authors gratefully acknowledge many discussions with John Seinfeld that assisted in this research. Important suggestions were also made by Dr. William Hoppel of the Naval Research Laboratories. This research has been performed with support from the Coordinating Research Council.
Funding AgencyGrant Number
Coordinating Research CouncilUNSPECIFIED
Issue or Number:2
Record Number:CaltechAUTHORS:20150805-110721850
Persistent URL:
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:59219
Deposited By: Irina Meininger
Deposited On:02 Oct 2015 22:54
Last Modified:10 Nov 2021 22:16

Repository Staff Only: item control page