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Measuring anisotropic resistivity of single crystals using the van der Pauw technique

Borup, Kasper A. and Fischer, Karl F. F. and Brown, David R. and Snyder, G. Jeffrey and Iversen, Bo B. (2015) Measuring anisotropic resistivity of single crystals using the van der Pauw technique. Physical Review B, 92 (4). Art. No. 045210. ISSN 1098-0121. https://resolver.caltech.edu/CaltechAUTHORS:20150821-160740952

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Abstract

Anisotropy in properties of materials is important in materials science and solid-state physics. Measurement of the full resistivity tensor of crystals using the standard four-point method with bar shaped samples requires many measurements and may be inaccurate due to misalignment of the bars along crystallographic directions. Here an approach to extracting the resistivity tensor using van der Pauw measurements is presented. This reduces the number of required measurements. The theory of the van der Pauw method is extended to extract the tensor from parallelogram shaped samples with known geometry. Methods to extract the tensor for both known and unknown principal axis orientation are presented for broad applicability to single crystals. Numerical simulations of errors are presented to quantify error sources. Several benchmark experiments are performed on isotropic graphite samples to verify the internal consistency of the developed theory, test experimental precision, and characterize error sources. The presented methods are applied to a RuSb_2 single crystal at room temperature and the results are discussed based on the error source analysis. Temperature resolved resistivities along the a and b directions are finally reported and briefly discussed.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1103/PhysRevB.92.045210DOIArticle
http://journals.aps.org/prb/abstract/10.1103/PhysRevB.92.045210PublisherArticle
http://journals.aps.org/prb/supplemental/10.1103/PhysRevB.92.045210PublisherSupplemental Material
ORCID:
AuthorORCID
Snyder, G. Jeffrey0000-0003-1414-8682
Additional Information:©2015 American Physical Society. (Received 11 February 2015; revised manuscript received 16 June 2015; published 24 July 2015) The work was supported by the Danish National Research Foundation, Grant No. DNRF93 (Center for Materials Crystallography, DNRF93). K.A.B. is thankful for funding from the Danish Council for Independent Research (DFF), Grant No. 4090-00071, and the DFF Sapere Aude program. D.R.B. would like to acknowledge the support of the Resnick Sustainability Institute.
Group:Resnick Sustainability Institute
Funders:
Funding AgencyGrant Number
Danish National Research Foundation (DNRF)DNRF93
Danish Council for Independent Research (DFF)4090-00071
Resnick Sustainability InstituteUNSPECIFIED
Issue or Number:4
Record Number:CaltechAUTHORS:20150821-160740952
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20150821-160740952
Official Citation:Measuring anisotropic resistivity of single crystals using the van der Pauw technique Kasper A. Borup, Karl F. F. Fischer, David R. Brown, G. Jeffrey Snyder, and Bo B. Iversen Phys. Rev. B 92, 045210 http://dx.doi.org/10.1103/PhysRevB.92.045210
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:59823
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:24 Aug 2015 17:15
Last Modified:03 Oct 2019 08:50

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