CaltechAUTHORS
  A Caltech Library Service

Pulse Characteristic Display for Tunnel Emission Devices

Mead, C. A. (1962) Pulse Characteristic Display for Tunnel Emission Devices. Review of Scientific Instruments, 33 (3). pp. 376-377. ISSN 0034-6748. doi:10.1063/1.1717847. https://resolver.caltech.edu/CaltechAUTHORS:20150901-114712753

[img] PDF - Published Version
See Usage Policy.

179kB

Use this Persistent URL to link to this item: https://resolver.caltech.edu/CaltechAUTHORS:20150901-114712753

Abstract

Recent studies on tunnel emission devices have demonstrated that destruction normally occurs because of high temperature generated within the thin film structure while their electrical characteristics are being measured. This difficulty has been overcome to a large degree by pulse tests performed with the unit described here. The most useful data to be observed on devices designed to emit electrons into a vacuum are: (a) the voltampere characteristic of the diode (metal-insulator-metal structure), and (b) the transfer characteristic (i.e., emitted current vs diode current).


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1063/1.1717847DOIArticle
http://scitation.aip.org/content/aip/journal/rsi/33/3/10.1063/1.1717847PublisherArticle
Additional Information:© 1962 The American Institute of Physics. Received 08 December 1961.
Issue or Number:3
DOI:10.1063/1.1717847
Record Number:CaltechAUTHORS:20150901-114712753
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20150901-114712753
Official Citation:Pulse Characteristic Display for Tunnel Emission Devices Mead, C. A., Review of Scientific Instruments, 33, 376-377 (1962), DOI:http://dx.doi.org/10.1063/1.1717847
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:60011
Collection:CaltechAUTHORS
Deposited By: Kristin Buxton
Deposited On:01 Sep 2015 20:58
Last Modified:10 Nov 2021 22:28

Repository Staff Only: item control page