Mead, C. A. (1962) Pulse Characteristic Display for Tunnel Emission Devices. Review of Scientific Instruments, 33 (3). pp. 376-377. ISSN 0034-6748. doi:10.1063/1.1717847. https://resolver.caltech.edu/CaltechAUTHORS:20150901-114712753
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Abstract
Recent studies on tunnel emission devices have demonstrated that destruction normally occurs because of high temperature generated within the thin film structure while their electrical characteristics are being measured. This difficulty has been overcome to a large degree by pulse tests performed with the unit described here. The most useful data to be observed on devices designed to emit electrons into a vacuum are: (a) the voltampere characteristic of the diode (metal-insulator-metal structure), and (b) the transfer characteristic (i.e., emitted current vs diode current).
| Item Type: | Article | |||||||||
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| Additional Information: | © 1962 The American Institute of Physics. Received 08 December 1961. | |||||||||
| Issue or Number: | 3 | |||||||||
| DOI: | 10.1063/1.1717847 | |||||||||
| Record Number: | CaltechAUTHORS:20150901-114712753 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20150901-114712753 | |||||||||
| Official Citation: | Pulse Characteristic Display for Tunnel Emission Devices Mead, C. A., Review of Scientific Instruments, 33, 376-377 (1962), DOI:http://dx.doi.org/10.1063/1.1717847 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 60011 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | INVALID USER | |||||||||
| Deposited On: | 01 Sep 2015 20:58 | |||||||||
| Last Modified: | 10 Nov 2021 22:28 |
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