A Caltech Library Service

Step-step interaction on vicinal Si(001) surfaces studied by scanning tunneling microscopy

Persichetti, L. and Sgarlata, A. and Fanfoni, M. and Bernardi, M. and Balzarotti, A. (2009) Step-step interaction on vicinal Si(001) surfaces studied by scanning tunneling microscopy. Physical Review B, 80 (7). Art. No. 075315. ISSN 1098-0121. doi:10.1103/PhysRevB.80.075315.

[img] PDF - Published Version
See Usage Policy.


Use this Persistent URL to link to this item:


We report on measurements of step-step interaction on a flat Si(111)−(7×7) surface and on vicinal Si(001) surfaces with miscut angles ranging between 0.2° and 8°. Starting from scanning tunneling microscopy images of these surfaces and describing steps profile and interactions by the continuum step model, we measured the self-correlation function of single steps and the distribution of terrace widths. Empirical parameters, such as step stiffness and step-step interaction strength, were evaluated from the images. The present experiment allows to assess the dependence of the step-step repulsion on miscut angle, showing how parameters drawn from tunneling images can be used to interpolate between continuum mesoscopic models and atomistic calculations of vicinal surfaces.

Item Type:Article
Related URLs:
URLURL TypeDescription
Bernardi, M.0000-0001-7289-9666
Additional Information:© 2009 American Physical Society. Received 18 May 2009; revised manuscript received 15 July 2009; published 21 August 2009.
Issue or Number:7
Classification Code:PACS numbers: 68.35.B-, 81.05.Cy, 68.37.Ef
Record Number:CaltechAUTHORS:20150925-120457980
Persistent URL:
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:60525
Deposited By: George Porter
Deposited On:25 Sep 2015 20:01
Last Modified:10 Nov 2021 22:35

Repository Staff Only: item control page