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Precise measurements of Kα x-ray linewidths in Eu, Tm, and Ta

Wang, K.-C. and Hahn, A. A. and Boehm, F. (1978) Precise measurements of Kα x-ray linewidths in Eu, Tm, and Ta. Physical Review A, 17 (5). pp. 1735-1738. ISSN 0556-2791. https://resolver.caltech.edu/CaltechAUTHORS:WANpra78a

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Abstract

The widths of Kα1 and Kα2 x rays in Eu, Tm, and Ta have been measured to an accuracy of (2-4)% with a high-resolution spectrometer by means of third- and fourth-order diffraction from the (111) crystalline planes of a bent silicon crystal. The measured values confirm the results from calculations of the radiative, Auger, and Coster-Kronig widths. Possible effects from hyperfine interaction, Coulomb exchange interaction, and chemical shift are discussed.


Item Type:Article
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https://doi.org/10.1103/PhysRevA.17.1735DOIUNSPECIFIED
Additional Information:©1978 The American Physical Society Received 14 December 1977 We wish to thank H. Henrikson for helping in the experiment and Professor P. Lee and Professor P. Vogel for valuable discussions. We also wish to thank Professor P. Van Assche for generously providing the silicon crystal. This work was supported by the Department of Energy under Contract No. EY-76-C-03-0063.
Issue or Number:5
Record Number:CaltechAUTHORS:WANpra78a
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:WANpra78a
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:6165
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:27 Nov 2006
Last Modified:02 Oct 2019 23:30

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