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Experimental metrology to obtain thermal phonon transmission coefficients at solid interfaces

Hua, Chengyun and Chen, Xiangwen and Ravichandran, Navaneetha K. and Minnich, Austin (2017) Experimental metrology to obtain thermal phonon transmission coefficients at solid interfaces. Physical Review B, 95 (20). Art. No. 205423. ISSN 2469-9950. https://resolver.caltech.edu/CaltechAUTHORS:20160125-101850007

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Abstract

Interfaces play an essential role in phonon-mediated heat conduction in solids, impacting applications ranging from thermoelectric waste heat recovery to heat dissipation in electronics. From the microscopic perspective, interfacial phonon transport is described by transmission coefficients that link vibrational modes in the materials composing the interface. However, direct experimental determination of these coefficients is challenging because most experiments provide a mode-averaged interface conductance that obscures the microscopic detail. Here, we report a metrology to extract thermal phonon transmission coefficients at solid interfaces using ab initio phonon transport modeling and a thermal characterization technique, time-domain thermoreflectance. In combination with transmission electron microscopy characterization of the interface, our approach allows us to link the atomic structure of an interface to the spectral content of the heat crossing it. Our work provides a useful perspective on the microscopic processes governing interfacial heat conduction.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1103/PhysRevB.95.205423DOIArticle
https://journals.aps.org/prb/abstract/10.1103/PhysRevB.95.205423PublisherArticle
http://arxiv.org/abs/1509.07806arXivDiscussion Paper
Alternate Title:Fresnel transmission coefficients for thermal phonons at solid interfaces
Additional Information:© 2017 American Physical Society. Received 23 December 2016; revised manuscript received 17 March 2017; published 17 May 2017. The authors thank L. Lindsay, and N. Mingo for providing the first-principles calculations for silicon, Nathan Lewis group for the access to the ellipsometer, and the Kavli Nanoscience Institute (KNI) at Caltech for the availability of critical cleanroom facilities. X. C. thanks Melissa A. Melendes, Matthew H. Sullivan, and Carol M. Garland from the KNI for fabrication assistance, and Victoria W. Dix from the Lewis group at Caltech for the help with the ellipsometer measurements. This work was sponsored in part by the National Science Foundation under Grant No. CBET 1254213, and by Boeing under the Boeing-Caltech Strategic Research & Development Relationship Agreement. C.H. and X.C. contributed equally to this work.
Group:Kavli Nanoscience Institute
Funders:
Funding AgencyGrant Number
NSFCBET-1254213
Boeing-Caltech Strategic Research & Development Relationship AgreementUNSPECIFIED
Issue or Number:20
Record Number:CaltechAUTHORS:20160125-101850007
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20160125-101850007
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:63924
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:25 Jan 2016 19:25
Last Modified:03 Oct 2019 09:33

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